::: 2006 APEC Nanoscale Measurement Technology Forum :::

Date	Topic	Speaker
09/27/2006	2006 APEC Project Overview	Dr. Wei-En Fu
09/27/2006	State-of-the-Art Measurement Instruments for On-line Sizing and Detection of Sub-100 nm Airborne Particles	Dr. Hiromu Sakurai
09/27/2006	Nanotechnology Standardization	Dr. Jennifer Decker
09/27/2006	Light Scattering from Particles and Surface Roughness	Dr. T. Germer
09/27/2006	Standard Particles and Its applications in Japan	Dr. Mikio Hikata
09/27/2006	Study on Nanometer Indentation Testing Method	Dr. Sha Fei
09/28/2006	Nanometrology in Semiconductor Application	Dr. King Lee
09/28/2006	X-Ray Scattering Methods for Thin Film And Nanostructure Analysis	Prof. Richard J. Matyi
09/28/2006	A Traceable Thickness Determination in Order to Develop Thin Film Certified Reference Materials	Dr. T. Fujimoto
09/28/2006	Nanometrology of Thin Film Systems by X-ray	Prof. Laura E. Depero
09/28/2006	Thin Film Analysis by X-Rays, from Research and Development to Device Fabrication	Dr. K. Omote
09/28/2006	Current Status of Nano Metrology CRM Development in Korea	Dr. Yang Koo Cho