FY109 Project Executed by NML
Standards Maintenance and International Equivalence
- Industrial Service
- International Equivalence
- System Maintenance
Industrial and Scientific Metrology Technology
- Critical Dimension Metrology for Advanced Semiconductor Manufacturing Processes
- Nano Particle Metrology and Standard Technology
- Optical Metrology and Sensor Technology for EUV
Development of Legal Metrology Technology
- Study of New Technical Regulation for Pattern Approval of Gas Meter
- Pre-research on Regulatory Requirement for Pattern Approval of Electricity Meter
