17 June, Advance Semiconductor Metrology Forum

The Advance Semiconductor Metrology Forum (ASMF) is an international platform dedicated to metrology in semiconductor manufacturing. As traditional measurement methods reach their limits, technologies like X-ray, optical scattering, electron microscopy, and AI-driven metrology are gaining prominence. ASMF brings together experts from industry, academia, and national institutes to discuss solutions for advanced nodes (2 nm and below). Key topics include metrology on material purity analysis, front-end processes, and advanced packaging. Through technical presentations and discussions, the forum fosters innovation, enhances efficiency, and improves semiconductor yield and competitiveness.

19 June, Green Energy Symposium - Metrology, Testing and Certification

The Green Energy Symposium - Metrology, Testing and Certification is an international forum focused on the vital role of metrology in the green energy sector. As the global energy transition gains momentum, the need for rigorous testing, certification, and verification of technologies like PV, EV charging stations, BESS, power quality, and hydrogen energy is increasingly critical. This symposium brings together leading experts from industry, academia, and national research institutions to share insights and discuss innovative solutions for the accurate and reliable testing of green energy technologies. It serves as a collaborative platform for advancing metrology standards and driving progress in the sustainable energy landscape.

20 June, Technical Tour

A one-day tour is scheduled for 20 June, featuring a visit to the CMS laboratories focused on measurement standards. After lunch, the group will head to Beipu, Hsinchu, where participants will enjoy a traditional Hakka cultural experience through the unique tea ceremony.