On September 2, a delegation from the National Physical Laboratory (NPL), UK, led by Professor Fernando Araujo de Castro, visited NML to explore opportunities for collaboration in metrology. The delegation included Dr. Fernando Castro, Principal Scientist and Head of Science for Materials Metrology; Dr. Sebastian Wood, Principal Scientist; and Dr. Yameng Cao, Senior Scientist.

Professor Araujo de Castro shared NPL’s latest advancements in materials testing technologies and discussed potential future research directions. The discussions focused on how recent technological innovations could significantly enhance precision and efficiency in metrology within the semiconductor industry. The delegation also toured NML’s semiconductor testing laboratory, which features optical inspection and detection technologies used in both front-end and back-end semiconductor processes. It provided NPL representatives with a thorough understanding of NML’s expertise and capabilities.

Both parties are committed to deepening their cooperation to advance the semiconductor industry and support global metrology development, creating new opportunities and breakthroughs in the field.

Dr. Wei-En Fu, Deputy General Director of NML, (left 4) on behalf of NML, welcomed the visiting of Professor Fernando Araujo de Castro, NPL, UK (right 4).