| Patent Title | Region / Country | Patent No. | Granted Date | Expiration Date |
|---|
| Obtaining method and obtaining apparatus for geometric error of rotation axis |
TW |
I791343 |
20230201 |
20411130 |
| Obtaining method and obtaining apparatus for geometric error of dual rotation axes |
TW |
I785914 |
20221201 |
20411201 |
| Method and device for making tapered capillary |
TW |
I783693 |
20221111 |
20410921 |
| Laser based distance measurement device |
TW |
I616646 |
20180301 |
20370223 |
| Apparatus for measuring length of optical resonant cavity |
US |
10041782 |
20180807 |
20351227 |
| CN |
ZL201610461302.8 |
20191018 |
20360622 |
| Distance measurement device and distance measuring method thereof |
US |
10101451 |
20181016 |
20361207 |
| TW |
I595252 |
20170811 |
20360509 |
| CN |
ZL201610430722.X |
20201113 |
20360615 |
| Thermal needle probe |
US |
9891180 |
20180213 |
20360519 |
| TW |
I570412 |
20170211 |
20360103 |
| Apparatus for amplifying scattering intensity during transmission small angle x-ray scattering measurements |
US |
9297772 |
20160329 |
20340524 |
| TW |
I538565 |
20160611 |
20341013 |
| NL |
EP2863213 |
20191127 |
20341013 |
| JP |
6006768 |
20160916 |
20341014 |
| GB |
EP2863213 |
20191127 |
20341013 |
| FR |
EP2863213 |
20191127 |
20341013 |
| DE |
EP2863213 |
20191127 |
20341013 |
| CN |
ZL201410544535.5 |
20180126 |
20341014 |
| BE |
EP2863213 |
20191127 |
20341013 |
| Electrostatic force generator and force measurement system and accelerometer having the same |
US |
8800371 |
20140812 |
20321207 |
| Crosstalk measurement systems and methods for crosstalk measurement |
TW |
I478576 |
20150321 |
20311219 |
| Optical measurement apparatus |
TW |
I476391 |
20150311 |
20311101 |
| CN |
ZL201210421089.X |
20150121 |
20321028 |
| Positioning apparatus |
TW |
I431636 |
20140321 |
20301212 |
| Defect measuring apparatus and method thereof |
TW |
I426263 |
20140211 |
20301214 |
| Method and apparatus for measuring liquid crystal cell parameters |
TW |
I432715 |
20140401 |
20301215 |
| KR |
10-1374328 |
20140305 |
20310103 |
| CN |
ZL201010610643.X |
20140924 |
20301227 |
| Apparatus and method for controlling flow and thermal condition |
TW |
I401401 |
20130711 |
20300715 |
| Filtering lens, lighting apparatus, and operation method of lighting apparatus |
TW |
I387708 |
20130301 |
20291213 |
| Two dimensional colorimeter calibration apparatus |
TW |
I408698 |
20130911 |
20291214 |
| Adjustable standard low luminance device |
TW |
I408345 |
20130911 |
20291209 |
| Method and system for measuring squareness |
TW |
I392845 |
20130411 |
20291209 |
| Optical characteristic measurement apparatus |
TW |
I408352 |
20130911 |
20291020 |
| System and method for measuring pre-tilt angle of liquid crystal |
TW |
I437220 |
20140511 |
20291026 |
| CN |
ZL200910221056.9 |
20121010 |
20291108 |
| Generator and method for generating standard motion blur edge |
TW |
I387342 |
20130221 |
20281218 |
| Inspection method and system for display |
CN |
ZL200810187832.3 |
20120118 |
20281222 |
| Apparatus and method for providing light source with standard tone characteristics |
TW |
I387734 |
20130301 |
20281224 |
| Phase retardance inspection instrument |
US |
8130378 |
20120306 |
20300523 |
| CN |
ZL200810177684.7 |
20110914 |
20281123 |
| Clip for detecting bending forces and electrical characteristics |
US |
7882748 |
20110208 |
20291002 |
| TW |
I377343 |
20121121 |
20281110 |
| CN |
ZL200810181063.6 |
20121010 |
20281119 |
| Bending apparatus for flexible element |
TW |
I367324 |
20120701 |
20280914 |
| CN |
ZL200810211479.8 |
20110406 |
20280925 |
| Apparatus for quantifying mura characteristic and method thereof |
TW |
I375792 |
20121101 |
20280724 |
| Vacuum bending apparatus and method for the same |
TW |
I374263 |
20121011 |
20280427 |
| Method and system for inspecting characteristics of bended flexible unit |
US |
7971492 |
20110705 |
20290723 |
| TW |
I370248 |
20120811 |
20280501 |
| CN |
ZL200810099009.7 |
20120627 |
20280511 |
| Device and method for providing dynamic light standard |
TW |
I356289 |
20120111 |
20280313 |
| All-directional fall sensor and the method thereof |
US |
8028643 |
20111004 |
20300427 |
| TW |
I375033 |
20121021 |
20290401 |
| CN |
ZL200910129961.1 |
20110615 |
20290409 |
| Reflective film thickness measurement method |
US |
8059282 |
20111115 |
20291224 |
| Spectral image processing method |
TW |
I454655 |
20141001 |
20280424 |
| Reflective measurement method of film thickness by spectral image system |
TW |
I386617 |
20130221 |
20280424 |
| Device and method for optical nanoindentation measurement |
US |
7845214 |
20101207 |
20290721 |
| Device and method for optical nano tensile test |
TW |
I477775 |
20150321 |
20281225 |
| Device and method for optical nano indentation measurement |
TW |
I470221 |
20150121 |
20281225 |
| Image processing and controlling system |
US |
8212931 |
20120703 |
20310501 |
| TW |
I394453 |
20130421 |
20271226 |
| Radiation apparatus with capability of preventing heat convection |
US |
7838802 |
20101123 |
20290723 |
| TW |
I346199 |
20110801 |
20271129 |
| CN |
ZL200710199057.9 |
20101103 |
20271206 |
| Apparatus, method and recording medium for simulating mura pattern |
TW |
I345156 |
20110711 |
20271227 |
| Standard illuminant apparatus capable of providing standard LED light |
US |
8186840 |
20120529 |
20310329 |
| TW |
I354097 |
20111211 |
20271230 |
| Polarization measurement apparatus and method for inspecting defects and particles on wafer |
TW |
I357628 |
20120201 |
20270820 |
| Surface plasmon resonance detecting apparatus and method thereof |
US |
7593110 |
20090922 |
20280413 |
| TW |
I361275 |
20120401 |
20271011 |
| Method and apparatus for optical frequency measurement |
US |
7830526 |
20101109 |
20290102 |
| TW |
I336771 |
20110201 |
20271015 |
| JP |
4633103 |
20101126 |
20271106 |
| FR |
EP2051053 |
20160907 |
20280117 |
| Detection device for detecting magentic bead array on biochips |
TW |
I335429 |
20110101 |
20270514 |
| Pressure relief device and fabrication method of pressure relief element thereof and sphygmomanometer |
TW |
I371260 |
20120901 |
20280324 |
| Standard radiation source |
US |
7866882 |
20110111 |
20281126 |
| TW |
I312861 |
20090801 |
20270212 |
| Standard radiation source and system for calibrating an infrared device |
TW |
I311193 |
20090621 |
20261226 |
| Polarimeter |
TW |
I310831 |
20090611 |
20261114 |
| LED polarimeter |
TW |
I314641 |
20090911 |
20261114 |
| The apparatus and method for haze measurement |
TW |
I319811 |
20100121 |
20261026 |
| Device and method for measuring magnetic properties of metal material |
TW |
I310841 |
20090611 |
20261228 |
| An apparatus for inspecting sphygmomanometers |
TW |
I311049 |
20090621 |
20261213 |
| Method of optical frequency measurement |
US |
7564561 |
20090721 |
20280403 |
| TW |
I300471 |
20080901 |
20261024 |
| JP |
4620701 |
20101105 |
20270314 |
| Apparatus for measuring dimensions of particles |
TW |
I319085 |
20100101 |
20260718 |
| Optoelectronic system for sensing an electromagnetic filed at total solid angle by having at least one optical, modulator to change the intensity of an optical wave |
US |
7528358 |
20090505 |
20270403 |
| TW |
I280374 |
20070501 |
20251229 |
| Nano-indentation ultrasonic detecting system and method thereof |
US |
7621173 |
20091124 |
20271206 |
| TW |
I282858 |
20070621 |
20251229 |
| Optoelectric sensing system for electric field signal |
US |
7583866 |
20090901 |
20270420 |
| TW |
I286023 |
20070821 |
20251229 |
| Flow measuring device and manufacture method thereof |
US |
7377183 |
20080527 |
20260921 |
| TW |
I272374 |
20070201 |
20251128 |
| CN |
ZL200510129617.4 |
20081203 |
20251212 |
| Taste sensing mixture and a sensor using the same and a sensory system using the same |
TW |
I301542 |
20081001 |
20250104 |
| Object dimension measurement system |
TW |
I251074 |
20060311 |
20241214 |
| System for generating terahertz radiation and method thereof |
TW |
I278157 |
20070401 |
20241223 |
| Calibration device and method for nonlinearity displacement |
TW |
I243887 |
20051121 |
20241125 |
| A method and apparatus for measuring material properties |
TW |
I247100 |
20060111 |
20241102 |
| Optical pressure-sensing system and method for sensing pressure |
US |
7104135 |
20060912 |
20250128 |
| Apparatus for measuring electromagnetic signals |
TW |
I247119 |
20060111 |
20241026 |
| Apparatus for measuring luminance and method for the same |
TW |
I242637 |
20051101 |
20241026 |
| A humidity sensitive film and the fabrication method of the same |
TW |
I263670 |
20061011 |
20240920 |
| Portable blackbody furnace |
US |
7148450 |
20061212 |
20251016 |
| TW |
I276787 |
20070321 |
20241019 |
| CN |
ZL200410090981.X |
20080213 |
20241110 |
| Apparatus and method for measuring a numerical aperture of a lens of an interference microscope |
TW |
I263780 |
20061011 |
20240323 |
| Humidity sensor element, device and method for manufacturing thereof |
US |
7270002 |
20070918 |
20240920 |
| GB |
2407384 |
20061122 |
20240627 |
