Patent Name | Patent No. | Country | Acquisition Date | Effective Date | Expiration Date |
---|---|---|---|---|---|
Distance measurement device and distance measuring method thereof | 10,101,451 | USA | 20181115 | 20181016 | 20361207 |
Apparatus for measuring length of optical resonant cavity | 10,041,782 | USA | 20181016 | 20180807 | 20351227 |
Thermal needle probe | 9,891,180 | USA | 20180321 | 20180213 | 20360519 |
Apparatus for amplifying scattering intensity during transmission small angle x-ray scattering measurements | ZL201410544535.5 | China | 20180321 | 20180126 | 20341014 |
Laser based distance measurement device | I616646 | Taiwan | 20180316 | 20180301 | 20370223 |
Distance measurement device and distance measuring method thereof | I595252 | Taiwan | 20170904 | 20170811 | 20360509 |
Thermal needle probe | I570412 | Taiwan | 20170302 | 20170211 | 20360103 |
Apparatus for amplifying intensity during transmission small angle x-ray scattering measurements | 9,297,772 | USA | 20161130 | 20160329 | 20340524 |
Apparatus for amplifying scattering intensity during transmission small angle x-ray scattering measurements | 6006768 | JAPAN | 20161017 | 20160916 | 20341014 |
Method and apparatus for optical frequency measurement | EP2051053 | France | 20161004 | 20160907 | 20280117 |
Apparatus for amplifying scattering intensity during transmission small angle x-ray scattering measurements | I538565 | Taiwan | 20160616 | 20160611 | 20341013 |
Device and method for optical nano tensile test | I477775 | Taiwan | 20150408 | 20150321 | 20281225 |
Crosstalk measurement systems and methods for crosstalk measurement | I478576 | Taiwan | 20150408 | 20150321 | 20311219 |
Optical measurement apparatus | I476391 | Taiwan | 20150407 | 20150311 | 20311101 |
Optical measurement apparatus | ZL201210421089.X | China | 20150311 | 20150121 | 20321028 |
Device and method for optical nano indentation measurement | I470221 | Taiwan | 20150224 | 20150121 | 20281225 |
Electrostatic force generator and force measurement system and accelerometer having the same | 8,800,371 | USA | 20141205 | 20140812 | 20321207 |
Method and apparatus for measuring liquid crystal cell parameters | ZL201010610643.X | China | 20141023 | 20140924 | 20301227 |
Spectral image processing method | I454655 | Taiwan | 20141022 | 20141001 | 20280424 |
System and method for measuring pre-tilt angle of liquid crystal | I437220 | Taiwan | 20140520 | 20140511 | 20291026 |
Method and apparatus for measuring liquid crystal cell parameters | I432715 | Taiwan | 20140415 | 20140401 | 20301215 |
Positioning apparatus | I431636 | Taiwan | 20140407 | 20140321 | 20301212 |
Method and apparatus for measuring liquid crystal cell parameters | 10-1374328 | Korea | 20140403 | 20140305 | 20310103 |
Defect measuring apparatus and method thereof | I426263 | Taiwan | 20140303 | 20140211 | 20301214 |
Two dimensional colorimeter calibration apparatus | I408698 | Taiwan | 20130930 | 20130911 | 20291214 |
Adjustable standard low luminance device | I408345 | Taiwan | 20130917 | 20130911 | 20291209 |
Optical characteristic measurement apparatus | I408352 | Taiwan | 20130917 | 20130911 | 20291020 |
Apparatus and method for controlling flow and thermal condition | I401401 | Taiwan | 20130729 | 20130711 | 20300715 |
Image processing and controlling system | I394453 | Taiwan | 20130429 | 20130421 | 20271226 |
Method and system for measuring squareness | I392845 | Taiwan | 20130416 | 20130411 | 20291209 |
Filtering lens, lighting apparatus, and operation method of lighting apparatus | I387708 | Taiwan | 20130401 | 20130301 | 20291213 |
Apparatus and method for providing light source with standard tone characteristics | I387734 | Taiwan | 20130318 | 20130301 | 20281224 |
Reflective measurement method of film thickness by spectral image system | I386617 | Taiwan | 20130308 | 20130221 | 20280424 |
Generator and method for generating standard motion blur edge | I387342 | Taiwan | 20130301 | 20130221 | 20281218 |
System and method for measuring pre-tilt angle of liquid crystal | ZL200910221056.9 | China | 20130131 | 20121010 | 20291108 |
Clip for detecting bending forces and electrical characteristics | ZL200810181063.6 | China | 20130131 | 20121010 | 20281119 |
Clip for detecting bending forces and electrical characteristics | I377343 | Taiwan | 20121203 | 20121121 | 20281110 |
Apparatus for quantifying mura characteristic and method thereof | I375792 | Taiwan | 20121112 | 20121101 | 20280724 |
All-directional fall sensor and the method thereof | I375033 | Taiwan | 20121102 | 20121021 | 20290401 |
Vacuum bending apparatus and method for the same | I374263 | Taiwan | 20121019 | 20121011 | 20280427 |
Image processing and controlling system | 8,212,931 | USA | 20121019 | 20120703 | 20310501 |
Pressure relief device and fabrication method of pressure relief element thereof and sphygmomanometer | I371260 | Taiwan | 20120913 | 20120901 | 20280324 |
Method and system for inspecting characteristics of bended flexible unit | I370248 | Taiwan | 20120821 | 20120811 | 20280501 |
Bending apparatus for flexible element | I367324 | Taiwan | 20120718 | 20120701 | 20280914 |
Method and system for inspecting characteristics of bended flexible unit | ZL200810099009.7 | China | 20120716 | 20120627 | 20280511 |
Standard illuminant apparatus capable of providing standard LED light | 8,186,840 | USA | 20120613 | 20120529 | 20310329 |
All-directional fall sensor | 8,028,643 | USA | 20120417 | 20111004 | 20300427 |
Surface plasmon resonance detecting apparatus and method thereof | I361275 | Taiwan | 20120416 | 20120401 | 20271011 |
Inspection method and system for display | ZL200810187832.3 | China | 20120406 | 20120118 | 20281222 |
Phase retardance inspection instrument | 8,130,378 | USA | 20120402 | 20120306 | 20300523 |
Polarization measurement apparatus and method for inspecting defects and particles on wafer | I357628 | Taiwan | 20120312 | 20120201 | 20270820 |
Device and method for providing dynamic light standard | I356289 | Taiwan | 20120118 | 20120111 | 20280313 |
Reflective film thickness measurement method | 8,059,282 | USA | 20111222 | 20111115 | 20291224 |
Standard illuminant apparatus capable of providing standard LED light | I354097 | Taiwan | 20111218 | 20111211 | 20271230 |
All-directional fall sensor and the method thereof | ZL200910129961.1 | China | 20111003 | 20110615 | 20290409 |
Phase retardance inspection instrument | ZL200810177684.7 | China | 20111003 | 20110914 | 20281123 |
Method and system for inspecting characteristics of bended flexible unit | 7,971,492 | USA | 20111003 | 20110705 | 20290723 |
Radiation apparatus with capability of preventing heat convection | I346199 | Taiwan | 20111003 | 20110801 | 20271129 |
Apparatus, method and recording medium for simulating mura pattern | I345156 | Taiwan | 20111003 | 20110711 | 20271227 |
Standard radiation source | 7,866,882 | USA | 20111003 | 20110111 | 20281126 |
Method of optical frequency measurement | 4620701 | JAPAN | 20111003 | 20101105 | 20270314 |
Device and method for optical nanoindentation measurement | 7,845,214 | USA | 20110824 | 20101207 | 20290721 |
Bending apparatus for flexible element | ZL200810211479.8 | China | 20110504 | 20110406 | 20280925 |
Method and apparatus for optical frequency measurement | 4633103 | JAPAN | 20110321 | 20101126 | 20271106 |
Clip for detecting bending forces and electrical characteristics | 7,882,748 | USA | 20110308 | 20110208 | 20291002 |
Method and apparatus for optical frequency measurement | I336771 | Taiwan | 20110214 | 20110201 | 20271015 |
Radiation apparatus with capability of preventing heat convection | 7,838,802 | USA | 20110131 | 20101123 | 20290723 |
Method and apparatus for optical frequency measurement | 7,830,526 | USA | 20110131 | 20101109 | 20290102 |
Detection device for detecting magentic bead array on biochips | I335429 | Taiwan | 20110131 | 20110101 | 20270514 |
Radiation apparatus with capability of preventing heat convection | ZL200710199057.9 | China | 20101207 | 20101103 | 20271206 |
Apparatus for measuring dimensions of particles | I319085 | Taiwan | 20100209 | 20100101 | 20260718 |
The apparatus and method for haze measurement | I319811 | Taiwan | 20100204 | 20100121 | 20261026 |
Nano-indentation ultrasonic detecting system and method thereof | 7,621,173 | USA | 20100101 | 20091124 | 20271206 |
Surface plasmon resonance detecting apparatus and method thereof | 7,593,110 | USA | 20091008 | 20090922 | 20280413 |
Optoelectronic system for sensing an electric field signal | 7,583,866 | USA | 20091008 | 20090901 | 20270420 |
LED polarimeter | I314641 | Taiwan | 20090916 | 20090911 | 20261114 |
Standard radiation source | I312861 | Taiwan | 20090901 | 20090801 | 20270212 |
Method of optical frequency measurement | 7,564,561 | USA | 20090901 | 20090721 | 20280403 |
Polarimeter | I310831 | Taiwan | 20090715 | 20090611 | 20261114 |
Optoelectronic system for sensing an electromagnetic filed at total solid angle by having at least one optical, modulator to change the intensity of an optical wave | 7,528,358 | USA | 20090709 | 20090505 | 20270403 |
An apparatus for inspecting sphygmomanometers | I311049 | Taiwan | 20090707 | 20090621 | 20261213 |
Device and method for measuring magnetic properties of metal material | I310841 | Taiwan | 20090707 | 20090611 | 20261228 |
Standard radiation source and system for calibrating an infrared device | I311193 | Taiwan | 20090707 | 20090621 | 20261226 |
Flow measuring device and manufacture method thereof | ZL200510129617.4 | China | 20090108 | 20081203 | 20251212 |
Taste sensing mixture and a sensor using the same and a sensory system using the same | I301542 | Taiwan | 20081007 | 20081001 | 20250104 |
Method of optical frequency measurement | I300471 | Taiwan | 20081001 | 20080901 | 20261024 |
Flow measuring device and manufacture method thereof | 7,377,183 | USA | 20080811 | 20080527 | 20260921 |
Humidity sensor element, device and method for manufacturing thereof | 7,270,002 | USA | 20080701 | 20070918 | 20240920 |
Portable blackbody furnace | ZL200410090981.X | China | 20080307 | 20080213 | 20241110 |
Optoelectric sensing system for electric field signal | I286023 | Taiwan | 20071001 | 20070821 | 20251229 |
Nano-indentation ultrasonic detecting system and method thereof | I282858 | Taiwan | 20070709 | 20070621 | 20251229 |
Optoelectronic system for sensing an electromagnetic filed at total solid angle by having at least one optical, modulator to change the intensity of an optical wave | I280374 | Taiwan | 20070607 | 20070501 | 20251229 |
Flow measuring device and manufacture method thereof | I272374 | Taiwan | 20070504 | 20070201 | 20251128 |
System for generating terahertz radiation and method thereof | I278157 | Taiwan | 20070418 | 20070401 | 20241223 |
Portable blackbody furnace | I276787 | Taiwan | 20070414 | 20070321 | 20241019 |
Portable blackbody furnace | 7,148,450 | USA | 20070208 | 20061212 | 20251016 |
Humidity sensor element, device and method for manufacturing thereof | 2407384 | UK | 20070101 | 20061122 | 20240627 |
Optical pressure-sensing system and method for sensing pressure | 7,104,135 | USA | 20061110 | 20060912 | 20250128 |
A humidity sensitive film and the fabrication method of the same | I263670 | Taiwan | 20061020 | 20061011 | 20240920 |
Apparatus and method for measuring a numerical aperture of a lens of an interference microscope | I263780 | Taiwan | 20061019 | 20061011 | 20240323 |
Object dimension measurement system | I251074 | Taiwan | 20060324 | 20060311 | 20241214 |
A method and apparatus for measuring material properties | I247100 | Taiwan | 20060207 | 20060111 | 20241102 |
Apparatus for measuring electromagnetic signals | I247119 | Taiwan | 20060123 | 20060111 | 20241026 |
Calibration device and method for nonlinearity displacement | I243887 | Taiwan | 20051212 | 20051121 | 20241125 |
Humidity sensor element, device and method for manufacturing thereof | I242639 | Taiwan | 20051116 | 20051101 | 20231020 |
Apparatus for measuring luminance and method for the same | I242637 | Taiwan | 20051111 | 20051101 | 20241026 |
An apparatus for producing a micro- or nano-torsion | I242641 | Taiwan | 20051111 | 20051101 | 20231224 |
An optical angle encoder | I242636 | Taiwan | 20051111 | 20051101 | 20231116 |
A metrology-type spectroscopic ellipsometer | I230784 | Taiwan | 20050425 | 20050411 | 20231224 |
Force sensor using an optical fiber | I230785 | Taiwan | 20050425 | 20050411 | 20231229 |
Nano-electronic devices using discrete exposure method | I227516 | Taiwan | 20050221 | 20050201 | 20231225 |
Method and an apparatus of fiber noise cancellation for an optical frequency remote calibration | I227607 | Taiwan | 20050221 | 20050201 | 20231225 |
A method for fabricating a humidity sensitive film | 207356 | Taiwan | 20041124 | 20040621 | 20230824 |
Apparatus of micro-scale image velocimetry | I221516 | Taiwan | 20041015 | 20041001 | 20231111 |
Adjustment system for touch displacement sensors | 203498 | Taiwan | 20041015 | 20040511 | 20230909 |
Quartz crystal microbalance apparatus | I220687 | Taiwan | 20040914 | 20040901 | 20230828 |
An apparatus and a method for locking the wavelength of a laser beam | 194271 | Taiwan | 20040512 | 20031211 | 20221226 |
Solid-electrolyte type gas sensor and gas sensing device | 192089 | Taiwan | 20040408 | 20031111 | 20221014 |
Apparatus and method for stabilizing the frequency of a laser | 6,667,996 | USA | 20040211 | 20031223 | 20220710 |
Sanitary ceramic ware loading test method and device | 182966 | Taiwan | 20031212 | 20030701 | 20220924 |
Apparatus and method for stabilizing the frequency of a laser | 162183 | Taiwan | 20030103 | 20020801 | 20210426 |
Multi-range fiber-optic reflective displacement micrometer | 6,433,350 | USA | 20021011 | 20020813 | 20210509 |
Thickness gauge | 6,279,241 | USA | 20011228 | 20010828 | 20190705 |
Multi-range fiber-optic reflective displacement micrometer | 134986 | Taiwan | 20011029 | 20010516 | 20200607 |
Calibrator for contact and non-contact thermometer | 6,193,411 | USA | 20010321 | 20010227 | 20190608 |
Calibrator for contact and non-contact thermometer | 154662 | Taiwan | 20000505 | 19991211 | 20110224 |
Thickness gauge | 152633 | Taiwan | 20000306 | 19990921 | 20110302 |
Apparatus for measuring small angle based on total-internal-reflection effect | 152354 | Taiwan | 20000225 | 19990911 | 20090508 |
Heterodyne interferometry method for measuring physical parameters of medium | 5,946,096 | USA | 19990831 | 19990831 | 20170706 |
Heterodyne interferometry method for measuring physical parameters of medium | 102724 | Taiwan | 19990830 | 19990421 | 20170508 |
Optical vacuum pressure gauge | 5,908,988 | USA | 19990601 | 19990601 | 20171111 |
Optical vacuum pressure gauge | 94647 | Taiwan | 19980915 | 19980511 | 20170520 |
Method and device for automated measurement of microwave power with isothermal microcalorimeter | 88715 | Taiwan | 19971208 | 19970621 | 20160708 |
High pressure constant volume valve | 122361 | Taiwan | 19970723 | 19970311 | 20080516 |
Double side bread board | 96357 | Taiwan | 19950420 | 19941001 | 20060414 |
High-speed electronic switch having low effective series resistance | 5,387,802 | USA | 19950207 | 19950207 | 20130504 |
High-speed electronic switch having low effective series resistance | 67828 | Taiwan | 19950118 | 19940901 | 20130421 |
Automated apparatus and method for the reproduction of same color temperature luminous intensity standard light source | 5,302,883 | USA | 19940412 | 19940412 | 20121022 |
Automated apparatus and method for the reproduction of same color temperature luminous intensity standard light source | 60560 | Taiwan | 19930520 | 19930111 | 20120519 |