| Report | Summary | |
| No. | Report | Summary |
| 1 | Measurement System Validation Procedure for DC High Resistance Measurement System | The assessment report of Direct Current High Resistance Measurement System (system code: E14) in the National Measurement Laboratory is presented. The system provides a calibration service for a high resistance resistor, a megohm box, and a megohmmeter, etc., which of nominal decade values 1 MOhm, 10 MOhm, 100 MOhm, 1 GOhm, 10 GOhm, 100 GOhm and 1 TOhm. With the principle of differential resistance by automated dual source high resistance bridge, the ratio between calibration items (for example, a high resistance resistor, a megohm box) and standard resistor can be accurately measured, which can result in calibration value. The calibration of a megohmmeter is using the direct measurement method, which directly measured the standard high resistance of the standard resistor. The relative expanded uncertainty for the high resistance resistors calibration of the system, which under a 95 ％ level of confidence, is listed as follows: Nominal Value of Resistance 1 MOhm, 10 MOhm, 100 MOhm, 1 GOhm, 10 GOhm, 100 GOhm, 1 TOhm Coverage Factor 2, 2, 2, 2, 2, 2, 2 Relative Expanded Uncertainty (uOhm/Ohm) 9, 11, 15, 17, 31, 33, 73. |
| 2 | Instrument Calibration Technique for DC High Resistance System | A calibration procedure of Direct Current High Resistance Measurement System (system code: E14) in the National Measurement Laboratory is presented. The system provides a calibration service for a high resistance resistor, a megohm box, and a megohmmeter, etc., which of nominal decade values 1 MOhm, 10 M, 100 MOhm, 1 GOhm, 10 GOhm, 100 GOhm and 1 TOhm. The measurement is carried out by using an automated dual source high resistance bridge to measure the difference of the resistance (or so-called ratio) between the calibration item and the standard resistor. The relative expanded uncertainty of the system, which under a 95 ％ level of confidence, is listed as follows: Nominal Value of Resistance 1 MOhm, 10 MOhm, 100 MOhm, 1 GOhm, 10 GOhm, 100 GOhm,1 TOhm Coverage Factor 2, 2, 2, 2, 2, 2, 2. Relative Expanded Uncertainty (uOhm/Ohm) 9, 11, 15, 17, 31, 33, 73. |
| 3 | Measurement System Validation Procedure for the Microwave S-Parameters and Impedance System | This document is an assessment report for the microwave S-parameter measurement system (U02), which provides calibration service for microwave devices. The report describes the evaluation of the measurement uncertainties with the Network Analyzer. The system must be calibrated with appropriate calibration kits before performing any measurement. The post-calibration errors contribute to most of the measurement uncertainty. The calibration capabilities of this system are as follows. Measurement Parameters: S11, S22, S21, S12 Coaxial Connector Type: 2.4 mm, 2.92 mm, APC 3.5, Type N Waveguide Connector Type: WR15, WR10 Measurement Range: 0 to 1 for S11 ＆ S22, (Linear), -60 dB to 0 dB for S21＆ S12 (Devices with higher attenuation can be measured with the system, but it is not recommended since the uncertainties are higher) Measurement Frequency Range: 0.010 GHz to 18 GHz for Type N, 0.010 GHz to 26.5 GHz for APC 3.5, 0.045 GHz to 40 GHz for 2.92 mm, 0.05 GHz to 50 GHz for 2.4 mm, 50 GHz to 75 GHz for WR15, 75 GHz to 110 GHz for WR10. Expanded Uncertainty: refers to the above tables. Level of Confidence (Coverage Factor): 95 ％ (2). |
| 4 | Instrument Calibration Technique for Network Devices with Microwave S-parameters and Impedance System | This report describes procedures for measuring s-parameters of devices with the microwave s-parameters measurement system (U02). The report describes the measurement procedures with the network analyzer. The system must be calibrated with appropriate calibration kits before performing any measurement. The Full 2-port calibration technique are applied to calibrate the system for achieving better measuring uncertainties. The calibration capabilities of this system are as follows. Measurement Parameters: S11, S22, S21, S12. Connector Type: WR10, WR15, 2.4 mm, 2.92 mm, 3.5 mm, Type N Measurement Range: 0 to 1 for S11 ＆ S22 (Linear), -60 dB to 0 dB for S21 ＆ S12.(Devices with higher attenuation can be measured with the system, but it is not recommended since the uncertainties are higher ) Measurement Frequency Range: 0.010 GHz to 18 GHz for Type N, 0.010 GHz to 26.5 GHz for 3.5 mm, 0.045 GHz to 40 GHz for 2.92 mm, 0.045 GHz to 50 GHz for 2.4 mm, 50 GHz to 75 GHz for WR15, 75 GHz to 110 GHz for WR10. Expanded Uncertainty: refers to the above tables. Level of Confidence (Coverage Factor): 95 ％ (2). |
| 5 | Instrument Calibration Technique for Direct Current Resistance System | A calibration procedure of Direct Current Resistance Measurement System (system code: E13) in the National Measurement Laboratory is presented. The system provides a calibration service for a resistance resistor, decade resistance box, resistance box, multifunction calibrator, multimeter, etc., which of nominal decade values 0.1 mOhm, 0.001 Ohm, 0.01 Ohm, 0.1 Ohm, 1 Ohm, 10 Ohm, 100 Ohm, 1 kOhm, 10 kOhm and 100 kOhm. Besides, the resistance of 0.1 mOhm provides a high-current calibration service which of 100 A to 1000 A. |
| 6 | Measurement System Validation Procedure for Direct Current Resistance Measurement System | The assessment report of Direct Current Resistance Measurement System (system code: E13) in the National Measurement Laboratory is presented. The system provides a calibration service for a resistance resistor, decade resistance box, resistance box, multifunction calibrator, multimeter, etc., which of nominal decade values 0.1 mΩ, 0.001 Ω, 0.01 Ω, 0.1 Ω, 1 Ω, 10 Ω, 100 Ω, 1 kΩ, 10 kΩ and 100 kΩ Besides, the resistance of 0.1 mΩ provides a high-current calibration service which of 30 A to 1000 A. |
| 7 | Instrument Calibration Technique for Low Current System | This document describes the method to calibrate a current source or a current meter by the low current measurement system (system code EO8) at National Measurement Laboratory. This system provides calibration service of direct low current standards from 10 pA to 1 uA. The calibration theory, measurement method, and calibration procedure for this system are described in detail in this document. The measurement method is passing a low current to a standard resistor and using a direct voltage meter to measure the voltage difference of standard resistor. The value of the current is then calculated by the Ohm’s low The measurement range of this system includes 10 pA, 100 pA, 1 nA, 10 nA, 100 nA, and 1 uA. |
| 8 | Measurement System Validation Procedure for Low Current System | This document describes the low current measurement system (system code E08) at National Measurement Laboratory. This system provides calibration service of direct low current standards from 10 pA to 1 μA. The measurement method is passing the low current to a standard resistor and using a direct voltage meter to measure the voltage difference of the standard resistor. The value of the current is then calculated by the Ohm law. Nominal value 10 pA, 100 pA, 1 nA, 10 nA, 100 nA, 1 μA |
| 9 | Measurement System Validation Procedure for Standard Capacitance - Three-Terminal Capacitor | This document is an evaluation report of standard capacitance measurement system (E15) on three-terminal capacitor with nominal value 1 pF, 10 pF, 100 pF and 1000 pF. The three-terminal capacitor is the capacitor which has two coaxial connectors. The calibration method is using a precision automated capacitance bridge to compare standard capacitors with the capacitors under calibration. |
| 10 | Measurement System Validation Procedure for Quantum Hall Resistance Standard System | This document describes the uncertainty analysis method for the calibration of a DC standard resistor with the quantum Hall resistance measurement system (system code: E24). This system maintains the primary standard of DC resistance. The measurement method is based on the quantized resistance produced by the quantum Hall device under low temperature and high magnetic field. The values of the DC standard resistors under test with their measurement uncertainties can be obtained through a direct current comparator (DCC) with statistic processing from such a quantized resistance. This system provides the measurement on the DC standard resistors of 1 kΩ. The uncertainty analysis is according to the ISO/IEC Guide 98-3:2008, Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995). The following table shows the relative expanded uncertainty, level of confidence, and coverage factor of this system: Resistor value：1 kΩ；Relative expanded uncertainty：0.06 μΩ/Ω；Confidence level：95 ％ ; Coverage factor (k)：2 |
| 11 | Instrument Calibration Technique for Quantum Hall Resistance System | This instrument calibration technique describes the calibration procedures for the calibration of 1 kΩ standard resistor with the quantum Hall resistance measurement system (system code: E24). This system maintains the primary standard of the DC resistance. The measurement method is based on the quantized resistance produced by the quantum Hall device under low temperature and high magnetic field. The resistance of the DC standard resistors under test with their measurement uncertainties can be obtained through a direct current comparator (DCC) with statistic processing from such a quantized resistance. This system provides the measurement on the DC standard resistors of 1 kΩ. The uncertainty analysis is according to the ISO/IEC Guide 98-3:2008, Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995). The following table shows the relative expanded uncertainty, level of confidence, and coverage factor of this system: Resistor value：1 kΩ ; Relative expanded uncertainty (μΩ/Ω)：0.06 ; Level of confidence：95 ％ ; Coverage factor (k)：2 |
| 12 | Measurement System Validation Procedure for Standard Capacitance - Four-Terminal-Pair and Two-Terminal Capacitors | This document is an assessment report on the four-terminal-pair and two-terminal capacitors of capacitance calibration system (E15). The calibration method is using precision automated capacitance bridge to compare standard capacitors and capacitor under calibration. |
| 13 | Measurement System Validation Procedure for Standard Capacitance-Traced to Resistance Standard | This document is an assessment report on the capacitance traceability measurement system (system code: E29). It describes the calibration theory and uncertainty estimation for the derivation of capacitance standard based on the resistance standard. In the measurement chain of impedance standards, the capacitance standard is traceable to the dc quantum Hall resistance (dc QHR) standard through dc resistance and ac resistance. The steps of dissemination are as following: Firstly, the 1 kohm ac/dc resistor is measured in terms of the dc QHR using direct current comparator bridge. Then, using a 10:1 ac resistance bridge, the ac resistance value of a 10 kohm ac resistor is determined. Next the ac resistance values of two 100 kohm ac resistors are determined by the same 10:1 ac resistance bridge. Finally a quadrature bridge is used to compare two 1000 pF standard capacitors to these two 100 kohm ac resistors. The measurement chain of the 1000 pF capacitance standard is then complete. Then, the capacitance standard is disseminated from 1000 pF to 1 pF by using a 10:1 capacitance bridge. This document assessed the relative expanded uncertainty and coverage factor k of 1 pF, 10 pF, 100 pF, and 1000 pF capacitances. |
| 14 | Instrument Calibration Technique for Standard Capacitance-Traced to Resistance Standard | This document is the calibration procedure for capacitance traceability measurement system (system ID no. E29). In the measurement chain of impedance standards, the capacitance standard is traceable to the dc quantum Hall resistance (dc QHR) standard through dc resistance and ac resistance. The steps of dissemination are as following: Firstly, the 1 kohm ac/dc resistor is measured in terms of the dc QHR using direct current comparator bridge. Then, using a 10:1 ac resistance bridge, the ac resistance value of a 10 kohm ac resistor is determined. Next the ac resistance values of two 100 kohm ac resistors are determined by the same 10:1 ac resistance bridge. Finally a quadrature bridge is used to compare two 1000 pF standard capacitors to these two 100 kohm ac resistors. Then, the capacitance standard is disseminated from 1000 pF to 1 pF by using a 10:1 capacitance bridge. The document specifically describes the preparation, procedures of measurement, and data analysis of the measurement chain described above. |
| 15 | Instrument Calibration Technique for AC Magnetic Field(50 Hz to 1000 Hz)Calibration System | This document belongs to the low magnetic field measurement system (system code: B03), and describes how to calibrate gaussmeter using the AC Magnetic Field (50 Hz to 1000 Hz) Calibration System. Recommendations for equipment and supplies needed to implement such a system are presented along with the description of the required calibration procedure. The calibration capability of this calibration system is as follow. Measurement range: 0.5 μT to 50 μT Expanded uncertainty: 3.1×10-3 μT to 2.2×10-1 μT Coverage factor: k = 2.57 Level of confidence: 95 ％ |
| 16 | Measurement System Validation Procedure for AC Magnetic Field(50 Hz to 1000 Hz)Calibration System | Magnetic flux density is a derivative unit in metrology. The multi-layers Helmholtz coils provide the method to realize the standard of low magnetic flux density, and it can trace to the current, resistance and length standard. This document is an assessment report on the calibration system of the low magnetic flux density (system code: B03) of the National Measurement Laboratory. This calibration system provides traceability and calibration service of ac gaussmeter for the magnetic flux density from 0.5 μT to 50 μT, frequency range from 50 Hz to 1000 Hz. The calibration capability of this calibration system is as follow. Measurement range: 0.5 μT to 50 μT Frequency range: 50 Hz to 1000 Hz Expanded uncertainty: 3.1×10-3 μT to 2.2×10-1 μT Level of confidence (Coverage factor): 95 ％ (k = 2.57). |
| 17 | Measurement System Validation Procedure for Three-Phase AC Electrical Power Measurement System | This technical report describes the calibration uncertainty evaluation for the three-phase AC electrical power of the AC Power Measurement System (system code: E18) at National Measurement Laboratory. All uncertainty values stated in this report are calculated according to the "ISO/IEC Guide 98-3:2008, Uncertainty of measurement - Part 3: Guide to the expression of uncertainty in measurement (GUM: 1995)". |
| 18 | Instrument Calibration Technique for Three-Phase AC Electrical Power Measurement System | This technical report describes the calibration procedures for the three-phase AC electrical power of the AC Power Measurement System (system code: E18) at National Measurement Laboratory. The system equipment, procedures, data analysis, and report templates of the calibrations for Three-Phase active power, Three-Phase reactive power, voltage harmonics and current harmonics are described in the report. |
| 19 | Measurement System Validation Procedure for Three-Phase AC Electrical Energy Measurement System | This technical report describes the calibration uncertainty evaluation for the Three-Phase AC Electrical Energy Measurement System (system code: E18) at National Measurement Laboratory. All uncertainty values stated in this report are calculated according to the "ISO/IEC Guide 98-3:2008, Uncertainty of measurement - Part 3: Guide to the expression of uncertainty in measurement (GUM: 1995)". |
| 20 | Instrument Calibration Technique for Three-Phase AC Electrical Energy Measurement System | This technical report describes the calibration procedures for the three-phase AC electrical energy of the AC Power Measurement System (system code: E18) at National Measurement Laboratory. The system equipment, procedures, data analysis, and report templates of the calibrations for three-phase active energy and three-phase reactive energy are described in the report. |
| 21 | Taiwan FMCW Radar Speedometer verification and inspection capability report | A study by the IIHS found that for every 5 mph increase in speed, there’s a 4％ increase in the fatality rate of accidents. Speed affects reaction distance and impact force, with higher speeds leading to longer reaction distances and greater kinetic energy upon impact, resulting in more severe injuries and higher chances of fatalities. To deter speeding and prevent accidents, radar speedometers are deployed on roads. As radar technology advances, from single-frequency to frequency-modulated continuous wave (FMCW), this project aims to evaluate domestic inspection units’ technical capabilities in calibrating FMCW radar speedometers and draft regulations to ensure fair law enforcement and public trust in speed enforcement equipment. |
| 22 | Instrument Calibration Technique for DC Electrical Power Measurement System | This technical report is the traceability procedure for DC electricity meters. Its content describes the system instruments and equipment, calibration steps, analysis of calibration data, and calibration report template. |
| 23 | Technical Specification for the Verification and Inspection of FMCW radar speedometers | International standards and relevant regulations for radar speedometers, including OIML R91, NHTSA Radar Speedometer Specifications, PTB-A12.03, and the Technical Specifications for Verification and Inspection of Radar Speedometers(CNMV 91), were referenced to draft the specifications for the Technical Specifications for Verification and Inspection of Frequency Modulated Continuous Wave (FMCW) radar speedometers. The relevant inspection conditions were evaluated and harmonized based on recommendations from expert seminars. Ultimately, a draft Technical Specification for the Verification and Inspection of FMCW radar speedometers was completed, along with the successful organization of an expert seminar. |
| 24 | Instrument Calibration Technique for Accelerometer -Fringe-Counting Method | Absolute calibration means that calibration parameters can be traceable to base units directly. Base units are length, time,…, etc. Since the wavelength of He-Ne laser is used in this vibration laser interferometry calibration system (system code: V01), also called accelerometer primary calibration, the traceability to base units is introduced to the accelerometer’s sensitivity directly. From Fringe-Counting Method, adopted by this primary calibration system, calculate the accelerometer’s sensitivity via measurements of displacement under excitation by a shaker. Then through comparing the electrical output of the accelerometer under test with the pre-determined acceleration, accelerometer’s sensitivity is obtained. This procedure includes: preparation, calibration procedure, post-calibration, data analysis and calibration report. Currently, automation program takes data acquisition and result calculation to the calibration processes. The maximum relative expanded uncertainty is 0.49 ％ for charge sensitivity and 0.44 ％ for voltage sensitivity, with a coverage factor, approximately 2 at the level of confidence of 95 ％. The measurement range is from 50 Hz to 700 Hz. |
| 25 | Instrument Calibration Technique for Low Frequency Accelerometer–Sine Approximation Method | This document of Instrument Calibration Technique describes details of low frequency calibration system of the Dynamical Engineering Measurement Laboratory of the National Measurement Laboratory follows ISO16063-11：1999 to take the data by laser interferometer sine spproximation method to calibrate the sensitivity of the accelerometer. This calibration system belongs to the low frequency vibration calibration system. The identification no. is V04. The idiom、words、symbol、and process of assessment of measurement uncertainty conforms to ISO/IEC Guide 98-3:2008 and TAF. The measurement frequency range is from 0.1 Hz to 160 Hz and system capability is shown as below. The result of accelerometer voltage sensitivity is expressed in term of V/(m/s^2) with a level of confidence 95 ％. |
| 26 | Measurement System Validation Procedure for Low Frequency Accelerometer Calibration System– Sine Approximation Method | This Measurement System Validation Procedure (MSVP) describes the estimation of the measurement uncertainty referred to ISO 16063-11:1999 for low frequency vibration calibration system based on the Sine Approximation Method (system code: V04). The result of the accelerometer voltage sensitivity is expressed in terms of V/( m/s^2). The idiom, words, symbol, and process of assessment of measurement uncertainty conform to ISO/IEC Guide 98-3:2008 and TAF. The frequency is in the range of 0.1 Hz to 160 Hz. The relative expanded uncertainty of this system is from 1.3 ％ to 1.7 ％ with a coverage factor about 2, under 95 ％ level of confidence. |
| 27 | Instrument Calibration Technique for Accelerometer -Sine-Approximation Method | Absolute calibration means calibration parameters can be traceable to base units directly. Base units are length, time,…, etc. Since the wavelength of He-Ne laser is used in this vibration laser interferometry calibration system (system code: V01), also called accelerometer primary calibration, the traceability to base units is introduced to the accelerometer’s sensitivity directly. From Sine-Approximation Method, adopted by this primary calibration system, calculate the accelerometer’s sensitivity via measurements of displacement under excitation by a shaker. Then through comparing the electrical output of the accelerometer under test with the pre-determined acceleration, accelerometer’s sensitivity is obtained. This procedure includes: preparation, calibration procedure, post-calibration, data analysis and calibration report. Currently, automation program takes data acquisition and result calculation to the calibration processes. The relative expanded uncertainties of this vibration laser interferometry calibration system are, 0.76 ％ under 5000 Hz, 1.78 ％ up to 10000 Hz for the voltage sensitivity; and 0.79 ％ under 5000 Hz, 1.79 ％ up to 10000 Hz for the charge sensitivity, with a coverage factor, approximately 2 under the level of confidence of 95 ％. The measurement range is from 50 Hz to 10000 Hz. |
| 28 | Report of the Operational Procedures and the Flow of Control for the Self-calibrating Temperature Sensor | This report mainly designs the operating interface and the control-flow diagram of the self-calibrating temperature sensor, and the operational procedures is explained to how to realize the control process of the temperature self-correction. |
| 29 | Measurement and Calibration of Thermocouple | This technical report is mainly aimed at the thermocouple training course handout for "Taiwan-Paraguay Capacity Building Course", introduces the current situation and development directions of the new temperature standard, and the possible changes in the calibration and traceability chain. Meanwhile, they are reported that the principles of thermocouple, types, using temperature ranges, calibration methods, and explain the differences between comparison calibration and fixed point calibration. |
| 30 | The Design of the Control Circuit Board for the Self-calibrating Temperature Sensor | This report mainly explains the design and function of the control circuit board corresponding to the self-calibrating temperature sensor, so that the online calibration technology of the self-calibrating temperature sensor can be realized. |
| 31 | IMTS 2024 | IMTS is the largest manufacturing technology show, ranking alongside Germany’s EMO and Japan’s JIMTOF as one of the world’s top three machine tool exhibitions. The show attracts visitors from over 110 countries, with over 1,600 exhibitors and nearly 89,000 attendees. IMTS focuses on precision machining technology, with this year’s theme including grinders/abrasive machines,sawing and cutting off machines,dosing feeding and conveyance systems,CNC lathes,milling centers,additive manufacturing,intelligent automation,gears for mechanical components and green energy solutions and inspection equipment and systems software solutions. AIMOMET is the International Association of Machinists and Mechanical Engineers’ major exhibition on manufacturing technology. It is held every four years in Chicago, Illinois. The event brings together leading manufacturers, suppliers, and users of manufacturing technology to demonstrate the latest developments in the field. The exhibition covers a wide range of topics, including CNC lathes and mills, grinders and abrasives, sawing and cutting off machines, dosing feeding and conveyance systems, additive manufacturing, intelligent automation, special purpose machines and lasers, gears for mechanical components, and green energy solutions. In addition to the exhibition, AIMOMET also features conferences, seminars, and other events that provide opportunities for professionals in the field to network and learn about the latest advancements in manufacturing technology. |
| 32 | Title:Procedure for In-Situ Acoustic Performance Testing of Noise Barrier | This procedure is based on the standards “EN1793-6:2018＋A1:2021 Road traffic noise reducing devices - Test method for determining the acoustic performance - Part 6: Intrinsic characteristics - In-situ values of airbone sound insulation under direct sound field conditions” and “EN1793-5:2016 Road traffic noise reducing devices - Test method for determining the acoustic performance - Part 5: Intrinsic characteristics - In-Situ values of sound reflection under direct sound field conditions.” It serves as the operational basis for measuring the on-site acoustic performance of noise barriers. The document outlines the preparatory tasks, measurement steps, data analysis, and report generation involved in the measurement process. |
| 33 | Instrument Calibration Technique for Spectral Irradiance Standard Lamp of Spectroradiometric System | This document describes the procedures for the calibration of a spectral irradiance lamp by the spectroradiometric system (O03). The calibration is performed by substitution method. It describes the preparations, calibration procedure and post-calibration procedures. The calibration sample is a quartz halogen lamp or tungsten filament lamp. A substitution method is adapted to calibrate the spectral irradiance of the lamp by the standard lamp calibrated by NPL (National Physical Laboratory). The measurement capability of this system for the spectral irradiance standard lamp calibration is shown as follows: ‧ Wavelength range: 250 nm to 2400 nm The spectral irradiance range: 0.01 mW/(m2×nm) to 240 mW/(m2×nm) ‧ uncertainty: confidence level : 95 ％ 波長(nm) 相對擴充不確定度 涵蓋因子k 250 ≦ λ ≦ 270 2.3 ％ 1.96 270 ＜ λ ＜ 370 2.0 ％ 1.96 370 ≦ λ ≦ 770 1.6 ％ 1.96 770 ＜ λ ≦ 1100 1.9 ％ 1.96 1100 ＜ λ ≦ 1520 2.5 ％ 1.96 1520 ＜ λ ≦ 1800 2.8 ％ 1.96 1800 ＜ λ ≦ 2020 3.2 ％ 1.96 2020 ＜ λ ≦ 2170 4.0 ％ 1.96 2170 ＜ λ ≦ 2260 4.6 ％ 1.96 2260 ＜ λ ≦ 2400 5.6 ％ 1.96 |
| 34 | Evaluation Report for Spectral Irradiance Standard Lamp of Spectroradiometric System | This document states the uncertainty evaluation procedures for the spectral irradiance standard lamp calibration. Using substitution method, spectral irradiance lamps to be calibrated are compared with the spectral irradiance standard lamps in terms of the output optical signals obtained by the calibration system. The effects of the influential factors on this calibration system are considered to estimate the uncertainty according to the ISO “Guide to the Expression of Uncertainty in Measurement”, hereinafter called ISO GUM. This document is subordinated to the Spectroradiometric System (O03). The capability and uncertainty of current calibration service is stated as follows. Measurement scope: Wavelength: 250 nm to 2400 nm Spectral irradiance: 0.01 mW/(m2×nm) to 240 mW/(m2×nm) Relative expanded uncertainties: Wavelength (nm) Relative expanded uncertainty Coverage factor k 250 ≦ λ ≦ 270 2.4 ％ 1.96 270 ＜ λ ＜ 370 2.0 ％ 1.96 370 ≦ λ ≦ 770 1.7 ％ 1.96 770 ＜ λ ≦ 1100 1.9 ％ 1.96 1100 ＜ λ ≦ 1520 2.5 ％ 1.96 1520 ＜ λ ≦ 1800 2.8 ％ 1.96 1800 ＜ λ ≦ 2020 3.2 ％ 1.96 2020 ＜ λ ≦ 2170 4.0 ％ 1.96 2170 ＜ λ ≦ 2260 4.6 ％ 1.96 2260 ＜ λ ≦ 2400 5.6 ％ 1.96 *Confidence level 95 ％ |
| 35 | Instrument Calibration Techenique for Luminance Meter/ Luminance Colorimeter of Spectroradiometric System | This document describes how to use the spectroradiometer or spectral radiance standard lamp to calibrate Luminance Meter/ Luminance Colorimeter for industry. The present spectral radiance working standard is calibrated by the reference standard lamp which is traced to Physikalisch-Technische Bundesanstalt (PTB). This document is subordinated to the Spectroradiometric System (O03). ‧ Range: Luminance: 1 cd/m2 to 50000 cd/m2 Chromaticity Coordinates: 0.0 ~ 0.9 Correlated Color Temperature: 2500 K至3200 K ‧Expanded relative uncertainty: (confidence level: 95 ％) Luminance: 1.6 ％, coverage factor: 1.96 ‧Expanded uncertainty: (confidence level: 95 ％) Chromaticity Coordinates: x：0.0011, coverage factor: 1.97 Correlated Color Temperature: 8 K, coverage factor: 1.97 |
| 36 | Instrument Calibration Technique for llluminance Meter of Absolute Radiometer System | This document states the calibration procedure for Illuminance Meter and lumi-nous intensity of Absolute Radiometer System O06. Contents illustrate preliminary op-eration of calibration, calibration steps, and post-calibration procedure…etc. The cali-bration items are illuminance meter (lux meter) and chroma meter, which are calibrated by illuiminant A. The system can also be applied to calibrate the luminous intensity of the lamp. The capability for calibration of illuminance meter is as follows : ‧ Illuminance range: 25 lx to 1500 lx ‧ Luminous intensity: 25 cd to 90000 cd ‧ Chromaticity coordinate: 0.0 to 0.9 ‧ Correlated color temperture：2500 K to 3200 K The capability of this system could be renewed when measurement technology improved or equipment retrofitted. |
| 37 | Instrument Calibration Technique for Absolute Radiometer System | This report describes the instrument calibration techniques of the room temperature absolute radiometer. The system was designed based on the DC substitution theory. That is the optical radiant power is obtained through the substitution of the electrical power and the optical radiant power. This makes the optical standard trace to the electrical standard. The absolute radiometer is currently the primary standard of optical power measurement. The wavelength range and the radiant power range of the system are from 300 nm to 9000 nm and from 6 uW to 100 mW, respectively. The expanded uncertainty for the visible range is 0.30 ％. For other range, the expanded uncertainty is 0.52 ％. The coverage factor of the above uncertainties is 1.97. The confidence level is 95 ％. For luminance intensity measurement, the range is from 70 cd to 10000 cd. The expanded uncertainty is 0.72 ％, the coverage factor is 1.97, and the confidence level is 95 ％. For illuminance measurement, the range is from 70 lx to 10000 lx. The expanded uncertainty is 0.75 ％, the coverage factor is 1.97, and the confidence level is 95 ％. The above uncertainties do not include the uncertainty from the test samples. |
| 38 | Measurement System Validation Report for Absolute Radiometer System | This report describes the validation method and system capability of the room temperature absolute radiometer. The radiometer was designed and established during the technical cooperation between CMS and CSIR (Council for Scientific and Industrial Research). The main function of this system is to provide the absolute measurement of radiant power in the wavelength range from 300 nm to 9000 nm and the calibration of radiant power responsivity for the optical detector. The measurement range of the radiant power is from 6 mW to 100 mW. The system was validated according to the parameter method. This report presents the sources and correction of the parameters which affect the accuracy of the measurement results. According to the measurement experience, documentary analysis, and internal comparison, the expanded uncertainty for radiant power measurement in the visible range is 0.30 ％ with a coverage factor 2.00; in the other range, the expanded uncertainty is 0.52 ％ with a coverage factor 1.98. The confidence level is 95 ％. The expanded uncertainties for radiant power responsivity measurement in the visible range and in the other range are 0.32 ％ with a coverage factor 1.99 and 0.54 ％ with a coverage factor 1.98, respectively. The confidence level is 95 ％. Please refer to chapter 3 for the details. |
| 39 | Measurement System Validation Report for Candela of Absolute Radiometer System | This report describes the candela standard which was established by CMS. The type of CMS candela standard was detector-based and it was designed following the CIE 1979 candela definition. Currently, the CMS candela standard was realized using the room temperature absolute radiometer. The transfer standard is the tungsten-type standard lamp. The system validation was performed according to the electrical and dimensional standards. This system belongs to absolute radiometer system (O06). The main function of this system is the measurement of absolute candela. Currently, the measurement range provided by the system is from 70 cd to 10000 cd, the relative expanded uncertainty is 0.72 ％, the coverage factor is 1.97, and the confidence level is 95 ％. The system can also be applied for the illuminance absolute responsivity measurement. For illuminance measurement, the range is from 70 lx to 10000 lx. The relative expanded uncertainty is 0.75 ％, the coverage factor is 1.97, and the confidence level is 95 ％. The system validation is based on the parameter method. The error sources and the analysis method are presented in this report. The system measurement capability and the expanded uncertainty are analyzed according to the real measurement data. Please refer to chapter 3 for the details. |
| 40 | Instrument Calibration Technique for Gloss Standard Plate of Luminous Flux System | This document describes the calibration procedure for gloss standard plate at 20°, 60°and 85° geometry condition defined by ASTM D523 and related standards. The geometry condition at 20°, 60° and 85° is that the axis of the incident beam is at 20°, 60°and 85°angles from the perpendicular to the gloss standard surface. The axis of receptor shall be at the mirror reflection of the axis of the incident beam. The DUT (Device Under Test) may consist of black glass, quartz, ceramics or metal painted surface with certain thickness. After calibration, the DUT can serve as the calibration standard in secondary laboratory or for the commercial gloss meter. This system is subordinated to the Total Luminous Flux System (O02). |
| 41 | Measurement System Validation Procedure for Gloss Standard Plate of Luminous Flux System | The document describes how to evaluate the precision and the accuracy of the gloss measurement system by statistic method. The geometry condition of the system is guided by ASTM D523. It defines the geometry condition of measurement at 20°, 60° and 85°.(The axis of the incident beam is at 20°, 60° and 85° angles from the perpendicular to the gloss standard surface. The axis of receptor shall be at the mirror reflection of the axis of the incident beam.) The gloss standard and the DUT (Device Under Test) is tested in the same geometry condition to obtain the gloss unit of the DUT. Establish the calibration procedure and measurement quality control by testing and evaluating the system. At the same time, execute the short-term experiments and analysis the testing data to draw the control chart of the gloss measurement system. This system is subordinated to the Total Luminous Flux System (O02). |
| 42 | Instrument Calibration Technique for Radiant Power of Absolute Radiometer System | This document describes the procedures for radiant power calibration. The working standard of this system is a pyroelectric radiometer. It can be applied to calibrate the radiometers, laser power meters, and the radiant power and radiance of the light sources. If the DUT (device under test) is a radiometer or power meter, the calibration method is substitution method. That is to measure a light source (with certain wavelength) by the DUT and the working standard respectively, then comparing their readings to find out the correction factor of the DUT. If the DUT is a light source, measure its radiant power by the working standard directly. The working standard can be traced to the CMS primary standard, the room temperature absolute radiometer. The measurement capability of the system is from 50 uW to 150 mW for radiant power and from 50 uW/cm2 to 150 mW/cm2 for irradiance. Under confidence level of 95 ％, relative expanded uncertainty is 2.9％ ~ 6.2 ％ with coverage factor of 1.97 The uncertainty depends on the characteristics of the light source and the DUT. Please refer to its evaluation report for the details of uncertainty analysis. |
| 43 | Measurement System Validation Procedure for Radiant Power of Absolute Radiometer System | This document describes the procedures for realization of optical radiance through the usage of the room temperature absolute radiometer. The work standard is the pyroelectric radiometer which is calibrated by the room temperature absolute radiometer. The check standard is an UVA detector which is applied for system controlling. This system is subordinated to the absolute radiometer system. The system code is O06. The main functions of this system are the radiant power and irradiance measurements for light source, and the calibrations of power meters and irradiance meters. The measurement capability of the system is from 50 mW to 150 mW for radiant power and from 50 uW/cm2 to 150 mW/cm2 for irradiance. Under confidence level of 95 ％, relative expanded uncertainty is 2.9％ ~ 6.2 ％ with coverage factor of 95 ％. This report presents the sources and the estimation method of uncertainty. The uncertainties are estimated according to the measurement data. Please refer to Chapter 3 and Appendix 1 for the details. |
| 44 | Measurement System Validation Procedure for Luminance Colorimeter of Spectroradiometric System | This document describes the uncertainty evaluation of the spectral radiance standard lamp calibration by a specific measurement quality assurance and uncertainty analysis. According to the calibration procedures and principles of measurement, we analyze the data and estimate the capability of the system. The calibration range and uncertainty are listed as follows. This document is subordinated to the Spectroradiometric System(O03). ‧Range: Item Range Wavelength 380 nm to 780 nm Luminance 1 cd/m2 to 58000 cd/m2 Spectral radiance 2 μW/(m2·nm·sr) to 2 W/(m2·nm·sr) Chromaticity coordinates (x, y) (0,0) to (0.9, 0.9) Chromaticity coordinates (u, v) (0,0) to (0.62, 0.39) Chromaticity coordinates (u′, v′) (0,0) to (0.62, 0.60) Correlated color temperature 2500 K to 3200 K ‧Uncertainty: (confidence level: 95 ％) ‧Item：Spectral radiance DUT：Spectralradiometer, spectral radiance standard lamp DUT Viewing angle Luminance (cd/m2) Wavelength (nm) Relative expanded uncertainty (％) Coverage factor Spectral-radiometer 1o 1 ~ 250 380 ≦ λ ＜ 385 3.3 1.96 385 ≦ λ ＜ 410 3.1 1.96 410 ≦ λ < 445 2.9 1.97 445 ≦ λ ≦ 780 2.6 1.97 ＞250 ~ 18000 380 ≦ λ ＜ 385 2.3 1.97 385 ≦ λ ＜ 420 2.0 1.96 420 ≦ λ < 435 1.4 1.96 435 ≦ λ ≦ 780 1.2 1.97 0.2o、0.1o 755 ~ 58000 380 ≦ λ ＜ 385 3.9 1.97 385 ≦ λ < 420 2.4 1.96 420 ≦ λ ＜ 550 1.7 1.96 550 ≦ λ ≦ 780 1.4 1.97 ? DUT Viewing angle Luminance (cd/m2) Wavelength (nm) Relative expanded uncertainty (％) Coverage factor Spectral radiance standard light source 1o 1 ~ 250 380 ≦ λ ＜ 385 3.5 1.97 385 ≦ λ ＜ 410 3.4 1.97 410 ≦ λ < 445 3.0 1.97 445 ≦ λ ≦ 780 2.6 1.97 ＞250 ~ 18000 380 ≦ λ ＜ 385 2.6 1.97 385 ≦ λ ＜ 420 2.5 1.97 420 ≦ λ < 435 1.5 1.97 435 ≦ λ ≦ 780 1.3 1.97 0.2o、0.1o 755 ~ 58000 380 ≦ λ ＜ 385 4.1 1.97 385 ≦ λ < 420 2.8 1.97 420 ≦ λ ＜ 550 1.8 1.97 550 ≦ λ ≦ 780 1.5 1.97 ‧Item：Luminance DUT Viewing angle Luminance (cd/m2) Relative expanded uncertainty (％) Coverage factor Spectral-radiometer 1o 1 ~ 250 2.6 1.96 ＞250 ~ 18000 1.2 1.96 0.2o、0.1o 755 ~ 58000 1.5 1.96 Spectral radiance standard light source 1o 1 ~ 250 2.6 1.96 ＞250 ~ 18000 1.3 1.96 0.2o、0.1o 755 ~ 58000 1.6 1.96 |
| 45 | Instrument Calibration Technique for Spectral Radiance Standard Light Source of Spectroradiometric System | Abstract This document describes the calibration procedures of spectral radiance light source. The calibration procedure is performed by directly method, using calibrated spectroradiometer to calibrate the spectral radiance light source to get spectral radiance, luminance, chromaticity coordinates and color temperature of the working standard light source and test spectral radiance light source. This document is subordinated to the Spectroradiometric System (O03). ‧Range: Item Range Wavelength 380 nm to 780 nm Luminance 1 cd/m2 to 58000 cd/m2 Spectral radiance 2 μW/(m2·nm·sr) to 2 W/(m2·nm·sr) Chromaticity coordinates (x, y) (0,0) to (0.9, 0.9) Chromaticity coordinates (u, v) (0,0) to (0.62, 0.39) Chromaticity coordinates (u′, v′) (0,0) to (0.62, 0.60) Correlated color temperature 2500 K to 3200 K ‧Uncertainty of measurement: (confidence level:95 ％) ‧Item：Spectral radiance DUT Viewing angle Luminance (cd/m2) Wavelength (nm) Relative expanded uncertainty (％) Coverage factor Spectral radiance standard light source 1o 1 ~ 250 380 ≦ λ ＜ 385 3.5 1.97 385 ≦ λ ＜ 410 3.4 1.97 410 ≦ λ < 445 3.0 1.97 445 ≦ λ ≦ 780 2.6 1.97 ＞250 ~ 18000 380 ≦ λ ＜ 385 2.6 1.97 385 ≦ λ ＜ 420 2.5 1.97 420 ≦ λ < 435 1.5 1.97 435 ≦ λ ≦ 780 1.3 1.97 0.2o、0.1o 755 ~ 58000 380 ≦ λ ＜ 385 4.1 1.97 385 ≦ λ < 420 2.8 1.97 420 ≦ λ ＜ 550 1.8 1.97 550 ≦ λ ≦ 780 1.5 1.97 ‧Item：Luminance DUT Viewing angle Luminance (cd/m2) Relative expanded uncertainty (％) Coverage factor Spectral radiance standard light source 1o 1 ~ 250 2.6 1.96 ＞250 ~ 18000 1.3 1.96 0.2o、0.1o 755 ~ 58000 1.6 1.96 ‧Item：Chromaticity coordinates Viewing angle Luminance (cd/m2) Chromaticity coordinate Expanded uncertainty Coverage factor 1o 1 ~ 250 x 0.0010 1.97 y 0.0010 1.97 u 0.0007 1.97 v 0.0003 1.96 u′ 0.0007 1.97 v′ 0.0010 1.97 ＞250 ~ 18000 x 0.0007 1.97 y 0.0007 1.97 u 0.0004 1.97 v 0.0002 1.97 u′ 0.0004 1.97 v′ 0.0006 1.97 0.2o、0.1o 755 ~ 58000 x 0.0007 1.97 y 0.0008 1.97 u 0.0005 1.97 v 0.0002 1.97 u′ 0.0005 1.97 v′ 0.0006 1.97 ‧Item：Correlated Color Temperature Viewing angle Luminance (cd/m2) Expanded uncertainty (K) Coverage factor 1o 1 ~ 250 18 1.97 ＞250 ~ 18000 12 1.97 0.2o、0.1o 755 ~ 58000 13 1.97 |
| 46 | Measurement System Validation Procedure for Illuminance Meter of Absolute Radiometer System | This document states the uncertainty evaluation for Illuminance Meter and luminous intensity lamp of Absolute Radiometer System. The calibration items are illuminance meter, chroma meter, and luminous intensity standard lamp. According to the calibration principle and calibration procedure, the capability for calibration of illuminance meter is as follows. l Illuminance : Measurement range (lx) Relative expanded uncertainty (％) Coverage factor 25 to 90000 1.4 2.00 l Luminous intensity : Measurement range (cd) Relative expanded uncertainty (％) Coverage factor 25 至 90000 1.2 2 l Chromaticity coordinate : x y u v Expanded uncertainty 0.0012 0.0007 0.0008 0.0003 Coverage factor 1.97 1.97 1.97 1.97 l Correlated color temperature : Relative expanded uncertainty Coverage factor 29 K 1.97 The measurement uncertainty is evaluated according to ”ISO/IEC Guide 98-3:2008, Uncertainty of measurement - Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)”. |
| 47 | Instrument Calibration Technique for Spectroradiometer of Spectroradiometric System | This document describes the calibration procedures of spectroradiometer. The standard spectroradiometer calibration method is direct reading method, reading the spectral radiance of the reference spectral radiance source through usage of the spectroradiometer directly. The reference standard lamp is traced to National Institute Standards and Techonology (NIST). The correction factor of the spectroradiometer is obtained by comparing the readings of the spectroradiometer with the reference spectral radiance source. Customer’s spectroradiometer reads the working spectral radiance source through usage of the spectroradiometer directly. This document is subordinated to the Spectroradiometric System (O03). ‧Range: ‧Range: Item Range Wavelength 380 nm to 780 nm Luminance 1 cd/m2 to 58000 cd/m2 Spectral radiance 2 μW/(m2·nm·sr) to 2 W/(m2·nm·sr) Chromaticity coordinates (x, y) (0,0) to (0.9, 0.9) Chromaticity coordinates (u, v) (0,0) to (0.62, 0.39) Chromaticity coordinates (u′, v′) (0,0) to (0.62, 0.60) Correlated color temperature 2500 K to 3200 K ‧Uncertainty: (confidence level: 95 ％) ‧Item：Spectral radiance DUT Viewing angle Luminance (cd/m2) Wavelength (nm) Relative expanded uncertainty (％) Coverage factor Spectral- radiometer 1o 1 ~ 250 380 ≦ λ ＜ 385 3.3 1.96 385 ≦ λ ＜ 410 3.1 1.96 410 ≦ λ < 445 2.9 1.97 445 ≦ λ ≦ 780 2.6 1.97 ＞250 ~ 18000 380 ≦ λ ＜ 385 2.3 1.97 385 ≦ λ ＜ 420 2.0 1.96 420 ≦ λ < 435 1.4 1.96 435 ≦ λ ≦ 780 1.2 1.97 0.2o、0.1o 755 ~ 58000 380 ≦ λ ＜ 385 3.9 1.97 385 ≦ λ < 420 2.4 1.96 420 ≦ λ ＜ 550 1.7 1.96 550 ≦ λ ≦ 780 1.4 1.97 ‧Item：Luminance DUT Viewing angle Luminance (cd/m2) Relative expanded uncertainty (％) Coverage factor Spectral-radiometer 1o 1 ~ 250 2.6 1.96 ＞250 ~ 18000 1.2 1.96 0.2o、0.1o 755 ~ 58000 1.5 1.96 ‧Item：Chromaticity coordinates Viewing angle Luminance (cd/m2) Chromaticity coordinate Expanded uncertainty Coverage factor 1o 1 ~ 250 x 0.0010 1.97 y 0.0010 1.97 u 0.0007 1.97 v 0.0003 1.96 u′ 0.0007 1.97 v′ 0.0010 1.97 ＞250 ~ 18000 x 0.0007 1.97 y 0.0007 1.97 u 0.0004 1.97 v 0.0002 1.97 u′ 0.0004 1.97 v′ 0.0006 1.97 Viewing angle Luminance (cd/m2) Chromaticity coordinate Expanded uncertainty Coverage factor 0.2o、0.1o 755 ~ 58000 x 0.0007 1.97 y 0.0008 1.97 u 0.0005 1.97 v 0.0002 1.97 u′ 0.0005 1.97 v′ 0.0006 1.97 ‧Item：Correlated Color Temperature Viewing angle Luminance (cd/m2) Expanded uncertainty (K) Coverage factor 1o 1 ~ 250 18 1.97 ＞250 ~ 18000 12 1.97 0.2o、0.1o 755 ~ 58000 13 1.97 |
| 48 | Instrument Calibration Technique for Photodetector Spectral Responsivity of Spectroradiometric System | This document is the calibration procedure for photodetector spectral responsivity of spectroradiometric system(O03). It describes the preparations, calibration procedure and post-calibration procedure. The test sample is Si photodetector, Ge photodetector, InGaAs photodetector or V(λ) photodetector. Utilizing substitution method to calibrate the spectral responsivity of test photodetector by the standard photodetector. The capability and uncertainties of photodetector spectral responsivity calibration is showed as follows: Type Wavelength (nm) Coverage factor Relative expanded uncertainty (％) Si detector 250 ≦ λ ＜ 260 2.44 3.3 260 ≦ λ ＜ 300 2.00 2.4 300 ≦ λ ＜ 380 1.96 1.8 380 ≦ λ ＜ 420 1.98 1.1 420 ≦ λ ＜ 540 2.04 0.74 540 ≦ λ ≦ 920 2.00 0.49 920 ＜ λ ≦ 1100 1.96 0.84 Type Wavelength (nm) Coverage factor Relative expanded uncertainty (％) Ge detector / InGaAs detector 800 ≦ λ ≦ 910 1.96 0.59 910 ＜ λ ＜ 1600 1.96 0.79 1600 ≦ λ ≦ 1650 1.96 0.94 Type Wavelength (nm) Coverage factor Expanded uncertainty V(λ) detector 380 ≦ λ ≦ 450 1.96 0.00064 450 ＜ λ ≦ 490 1.97 0.0025 490 ＜ λ ＜ 620 1.99 0.0059 620 ≦ λ ＜ 670 1.96 0.0027 6760 ≦ λ ＜ 730 1.96 0.00064 730 ≦ λ ≦ 780 1.96 0.000022 |
| 49 | Measurement System Validation Procedure for Photodetector Spectral Responsivity of Spectroradiometric System | This document discribes the evaluation of the measurement uncertainties of photodetector spectral responsivity calibration of the Spectroradiometric System (System ID number: O03). The devices under test could be a Si photodiode, a Ge photodiode, an InGaAs photodiode, or a V(λ) detector. The system provides calibration services for the wavelength range from 250 nm to 1650 nm. The uncertainties varies by different quantaties (relative spectral responsivity or absolute spectral responsivity), devices under test, and wavelength ranges. Chapter 2 describes the system setup and the principles of measurement. Chapter 3 illustrates uncertainty analysis according to ISO/IEC Guide 98-3: 2008 [7.1]; the calibrated uncertainty results are included. Chapter 4 describes measurement quality assurance. Chapter 5 and Chapter 6 summarise the previously described contents and conclude measurement capability of photodiode spectral responsivity. Type Wavelength (nm) Coverage factor Relative expanded uncertainty (％) Si detector 250 ≦ λ ＜ 260 2.44 3.3 260 ≦ λ ＜ 300 2.00 2.4 300 ≦ λ ＜ 380 1.96 1.8 380 ≦ λ ＜ 420 1.98 1.1 420 ≦ λ ＜ 540 2.04 0.74 540 ≦ λ ≦ 920 2.00 0.50 920 ＜ λ ≦ 1100 1.96 0.85 Type Wavelength (nm) Coverage factor Relative expanded uncertainty (％) Ge detector / InGaAs detector 800 ≦ λ ≦ 910 1.96 0.6 910 ＜ λ ＜ 1600 1.96 0.8 1600 ≦ λ ≦ 1650 1.96 1.0 Type Wavelength (nm) Coverage factor Expanded uncertainty V(λ) detector 380 ≦ λ ≦ 450 1.96 0.00063 450 ＜ λ ≦ 490 1.97 0.0025 490 ＜ λ ＜ 620 1.99 0.0059 620 ≦ λ ＜ 670 1.96 0.0022 6760 ≦ λ ＜ 730 1.96 0.00064 730 ≦ λ ≦ 780 1.96 0.00002 |
| 50 | Instrument Calibration Technique for Optical Power by the Cryogenic Radiometer System | This document describes the procedures for radiant flux (radiant power, optical power) calibration (primary calibration), administratively corresponding to the Cryogenic Radiometer System (O07). The standard is the cryogenic radiometer and the device under test is light sources, including but not limited to laser, monochromated light...etc. |
| 51 | Instrument Calibration Technique for Color Standards in the 0°:45°a geometry of Spectrophotometric System | This document describes how to use a double beam spectrophotometric system to calibrate the chromaticity coordinates and reflectance factor under the 0°:45°a geometric condition of standard white. The 0°:45°a measurement geometric condition is that the optic source projects the white board in the orthogonal direction, and we measure the reflection at 45°. The calibrated standard board can be used as the standard for spectrophotometer under the same geometric condition for vendor, or as the standard for estimating the sample color by naked eyes. However, the calibration procedure is not suitable for the board which contains translucent or fluorescent materials. The evaluation of this system is based on the establishment of the calibration procedure and the measurement quality assurance. This system is attached to Spectrophotometric System (system code: O05). The measurement capability is shown as follows. (1)Item and Range: Radiance factor Y ＞ 1, spectral radiance factor ＞ 0.01, and lightness L* ＞ 1; 0 to 1 for chromaticity coordinates x and y; 0 to ＋- 500 for chromaticity coordinates a* and 0 to ＋- 200 for chromaticity coordinates b*. (2)Measurement Uncertainty White Plate Expanded uncertainty of reflectance factor Y: 0.13,k = 1.96 Expanded uncertainty of chromaticity coordinates x and y: 0.0004 and 0.0004, k = 1.99 Expanded uncertainty of lightness L*: 0.12, k = 1.96 Expanded uncertainty of chromaticity coordinates a* and b*: 0.08 and 0.08, k = 1.97 Expanded uncertainty of spectral radiance factor is 0.0034 at (380~780) nm, k = 1.96 Color Plate: See the table in the report. |
| 52 | Measurement System Validation Procedure for Reflectance in the 0°:45°a Geometry of Spectrophotometric System | This document describes the measurement uncertainty evaluation for the radiance factor Y, L* and the chromaticity coordinates x, y, a* and b* of the white standard measured by the Spectrophotometer System (O05). The system is configured based on the 0o:45oa geometry recommended by the CIE (INTERNATIONAL COMMISSION ON ILLUMINATION). The calibration is performed by placing the standard plate and DUT on the sample port individually and then compare the measurement result. The System is subordinated to the Spectrophotometric System (O05). The system is evaluated based on the established calibration procedures and the measurement quality assurance program. In addition, take the readings of a set of white standard plates at different days to draw the system control chart. From the analytical results, the system capability is as follows. (1)Item and Range: Radiance factor Y ＞ 1, spectral radiance factor ＞ 0.01, and lightness L* ＞ 1; 0 to 1 for chromaticity coordinates x and y; 0 to ＋- 500 for chromaticity coordinates a* and 0 to ＋- 200 for chromaticity coordinate b*. (2)Measurement Uncertainty White Plate Expanded uncertainty of radiance factor Y: 0.13,k = 1.96 Expanded uncertainty of chromaticity coordinates x and y : 0.0004 and 0.0004 , k = 1.99 Expanded uncertainty of lightness L* : 0.12, k = 1.96 Expanded uncertainty of chromaticity coordinates a* and b*: 0.08 and 0.08, k = 1.97 Expanded uncertainty of spectral radiance factor is 0.0034 at (380~780) nm, k = 1.96 Color Plate: see the table in the report. |
| 53 | Instrument Calibration Technique in the Specular Reflectance of Spectrophotometric System | This document describes the calibration procedure for specular reflectance standard plate at the VW accessory in double-beam monochromator. This is a primary measurement system which measures the material’s absolute reflectance corrected by baseline and reference beam. While performing the total and zero reflectance, there would be a baseline factor, and then the reflectance can be measured directly. Finally, the measured value showed is corrected by reference beam further. This system is primary standard. the wavelength range is (250 ~ 2500) nm, and under the 95 ％ confidence level in the measuring range of reflectance (1 ~ 100) ％, the expanded uncertainty is 0.37％, and its coverage factor is 1.97. This document is subordinated to O05 Spectrophotometric System. |
| 54 | Instrument Calibration Technique for Optical Fiber Power Meter of Absolute Radiometer System | This is Calibration Procedure for Optical Fiber Power Meter of Absolute Radiometer System. Contents illustrate preliminary operation of calibration, calibration steps, and post-calibration procedure…etc. The test sample is fiber power meter. The power range is from 1 uW to 1 mW. The wavelengths are 1310 nm and 1550 nm. The relative expanded uncertainty is 1.7 ％, and .the coverage factor of the above uncertainty is 1.97 with confidence level of 95 ％. The capability of this system could be renewed when measurement technology improved or equipment retrofitted. |
| 55 | Measurement System Validation Procedure for Optical Fiber Power Meter of Absolute Radiometer System | This is Evaluation Report for Fiber Power Meter of Absolute Radiometer System, the sample under test is optical fiber power meter. According to the calibration principle and calibration procedure, the capability for fiber power meter calibration is as following: ‧ Wavelength：1310 nm ＆ 1550 nm ‧ Power range：1 uW ~ 1 mW ‧ Relative expanded uncertainty:1.7％ Coverage factor:1.97 |
| 56 | Measurement System Validation Procedure for LED Total Luminous Flux | This is the uncertainty evaluation report for the light emitting diodes (LEDs) total luminous flux measurement system (O02). This document contains the system description and the measurement principle and measurement method by using the integrating sphere photometer. The dynamic range of the LEDs total luminous flux measurement system is from 40 mlm to 800 lm with relative expanded uncertainty 3.4 ％ (depending on the LED characteristics) at a confidence level of 95 ％. |
| 57 | Instrument Calibration Technique for LED Total Luminous Flux | This document is the luminous flux measurement of light emitting diodes by using the integrating sphere photometer. By substitute and self-absorption method, the total luminous flux of the LED was compared to that of the calibrated standard lamp. The dynamic range of the LEDs luminous flux measurement system is from 40 mlm to 800 lm . |
| 58 | Instrument Calibration Technique for Averaged LED Luminous Intensity | This document describes the calibration procedures for the averaged luminous intensity of light emitting diodes (LEDs) measurement system (O02). The LED averaged luminous intensity is measured by detector-based method. Under fixed distances, the averaged luminous intensity of LEDs can be acquired from the inverse-squared law. The dynamic range of the LEDs averaged luminous intensity measurement system is from 10 mcd to 10000 mcd. |
| 59 | Measurement System Validation Procedure for LED Averaged Luminous Intensity | This is the uncertainty evaluation report for the averaged light emitting diodes (LEDs) luminous intensity measurement system (O02). This document contains the system description and the measurement principle and measurement method by detector-based method. The dynamic range of the averaged LEDs luminous intensity measurement system is from 10 mcd to 10000 mcd with relative expanded uncertainty ranging from 1.8 ％ to 1.9 ％ at a confidence level 95 ％. |
| 60 | Instrument Calibration Technique for LED Spectroradiometric Spectrum | This report is for the light emitting diodes (LEDs) spectral Spectrum measurement system. The document contains the system description and the measurement principle and measurement method. The spectral range of this system is from 380 nm to 780 nm. |
| 61 | Instrument Calibration Technique for Transmittance Haze Standard | This document describes the calibration procedures for the transmittance haze measurement system. The system which in compliance with ASTM D1003 (JIS K 7105) and ISO 14782 (JIS K 7136) standards is applicable to the measurement of the diffused materials with its transmittance haze below 40 ％. This calibration method is suitable for diffuse materials. The light enters the sample in a vertical direction and pass through the sample. The standard plate calibrated by this system can be a reference standard for the secondary calibration laboratory. This calibration system is subordinated to Haze Measurement System (O08). The wavelength measurement range of this system is (380 to 780) nm, and the measurement uncertainties under 95 ％ confidence level, are as follows. Standard: ASTM D1003 Range Expanded Uncertainty Coverage Factor 35 ％ ≦ H ＜ 40 ％ 0.64 ％ 1.98 25 ％ ≦ H ＜ 35 ％ 0.53 ％ 1.98 15 ％ ≦ H ＜ 25 ％ 0.38 ％ 2.00 7 ％ ≦ H ＜ 15 ％ 0.19 ％ 2.00 2 ％ ≦ H ＜ 7 ％ 0.12 ％ 2.00 0 ％ ≦ H ＜ 2 ％ 0.039 ％ 1.99 Standard: ISO 14782 (JIS K 7136) Range Expanded Uncertainty Coverage Factor 35 ％ ≦ H ＜ 40 ％ 0.62 ％ 1.98 25 ％ ≦ H ＜ 35 ％ 0.51 ％ 1.98 15 ％ ≦ H ＜ 25 ％ 0.36 ％ 1.98 7 ％ ≦ H ＜ 15 ％ 0.19 ％ 2.00 2 ％ ≦ H ＜ 7 ％ 0.12 ％ 2.00 0 ％ ≦ H ＜ 2 ％ 0.039 ％ 1.99 |
| 62 | Measurement System Validation Procedure for Transmittance Haze Measurement System | This document describes the system validation procedures for the transmittance haze measurement system. The system which in compliance with ASTM D1003 (JIS K 7105) and ISO14782 (JIS K 7136) standards is applicable to the measurement of the diffused materials with its transmittance haze below 40 ％. This document belongs to the transmittance haze measurement system (system code: O08). The wavelength measurement range is (380 to 780) nm. The uncertainties corresponding to approximately 95 ％ confidence level are as follows. Standard: ASTM D1003 (JIS K 7105) Range Expanded Uncertainty Coverage Factor 35 ％ ≦ H ＜ 40 ％ 0.64 ％ 1.98 25 ％ ≦ H ＜ 35 ％ 0.53 ％ 1.98 15 ％ ≦ H ＜ 25 ％ 0.38 ％ 2.00 7 ％ ≦ H ＜ 15 ％ 0.19 ％ 2.00 2 ％ ≦ H ＜ 7 ％ 0.12 ％ 2.00 0 ％ ≦ H ＜ 2 ％ 0.039 ％ 1.99 Standard: ISO 14782 (JIS K 7136) Range Expanded Uncertainty Coverage Factor 35 ％ ≦ H ＜ 40 ％ 0.62 ％ 1.98 25 ％ ≦ H ＜ 35 ％ 0.51 ％ 1.98 15 ％ ≦ H ＜ 25 ％ 0.36 ％ 1.98 7 ％ ≦ H ＜ 15 ％ 0.19 ％ 2.00 2 ％ ≦ H ＜ 7 ％ 0.12 ％ 2.00 0 ％ ≦ H ＜ 2 ％ 0.039 ％ 1.99 |
| 63 | Instrument Calibration Technique for Spectral Scattering Measurment System | This document describes the calibration procedure for reflectance at specified geometry condition and wavelength. According to the definition, reflectance can be calculated by the light source luminance and reflectance luminance. The calibrated standard plate can be the highest standard in secondary calibration laboratory. The incident angle is (0 ~ 60)° and the wavelength range is (380 ~ 800) nm. At a confidence level of 95 ％, the expanderd uncertainty is 0.59％ and its coverage factor is 2.05. The geometric condition for color measurement in O09 system is based on the CIE recommended 0°:45° geometry. The color uncertainty of Y, x, y is listed as follows. Reflectance Y: 0.16 ％; x:0.0003; y:0.0003;coverage factor:2.01 |
| 64 | Measurement System Validation Procedure for Spectral Scattering | This calibration system is subordinated to Scattering Measurement System. The measured wavelength is (380-800) nmand the incident angle is (0 ~ 60)°. Under 95 ％ confidence level, coverage factor is 2.05, the expanded uncertainty is 0.006. The geometric condition for color measurement in O09 system is based on the CIE recommending 0°:45° geometry. The color uncertainty is as follows. Expanded uncertainty of luminance factor Y : 0.16 , k = 2.01 Expanded uncertainty of chromaticity coordinates x : 0.0003 , k = 2.01 Expanded uncertain nty of chromaticity coordinates y : 0.0003 , k = 2.01 |
| 65 | Measurement System Validation Procedure for Absolute Reflectance in the VW Geometry of Spectrophotometric System | This document describes the method and the result of uncertainty evaluation in absolute reflectance VW measurement system. It includes the introduction of the system, the principle and procedure of the measurement, and so on. It also consists of the evaluation of the system capability and uncertainty. This system is primary standard. the wavelength range is (250 ~ 2500) nm, and under the 95 ％ confidence level in the measuring range of reflectance (1 ~ 100) ％, the expanded uncertainty is 0.37％, and its coverage factor is 1.97. This document is subordinated to O05 Spectrophotometric System. |
| 66 | Instrument Calibration Technique for Thin Film Measurement System by Spectroscopic Ellipsometer | This document describes the calibration procedure for standard thin film thickness by conducting Spectroscopic Ellipsometer (SE) measurement. This system provides the calibration ability of silicon dioxide (SiO2) thin film thickness from 1.5 nm to 1000 nm. A Spectroscopic Ellipsometer (SE) with a wavelength scanning range from 250 nm to 850 nm is employed and apply to characterize the physical and optical properties of the silicon dioxide (SiO2) thin films. The film thickness and the refractive index of a silicon dioxide layer was calculated and fitted based on the least square fit of the experimentally measured ellipsometric functions. The uncertainty analysis of measurement results is based on the method in the document: “ISO/IEC Guide 98-3:2008, Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)”. Each deviation that originated from the system and sample measurements are considered and evaluated carefully. After that, our measurement system currently provides the following capability. Calibration target：thin film thickness standard Range of SiO2 thin film thickness under calibration: 1.5 nm to 1000 nm Expanded uncertainty: 0.03 nm Confidence level: 95 ％ Coverage factor: 2 This document belongs to Thin Film Measurement System (D22). |
| 67 | Measurement System Validation Procedure for Thin Film Measurement System by Spectroscopic Ellipsometer | The uncertainty evaluation of thin film thickness calibration was described in this document for D22 system. The system provided the calibration ability of SiO2 thin film thickness from 1.5 nm to 1000 nm. A Spectroscopic Ellipsometer (SE) with a wavelength scanning range from 250 nm to 850 nm is employed to characterize the physical and optical properties of the silicon dioxide thin films. Both film thickness and the refractive index of a silicon dioxide layer were calculated based on the least square fit of the experimentally measured ellipsometric functions. The uncertainty analysis of measurement results is based on the method in the document: “ISO/IEC Guide 98-3:2008, Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)”. Each deviation that originated from the system and sample measurements are considered and evaluated carefully. After that, our measurement system provides the following capability. Calibration target：thin film thickness of SiO2 Range of SiO2 thin film thickness under calibration：1.5 nm to 1000 nm Expanded uncertainty：0.03 nm Confidence interval：about 95 ％ Coverage factor：2 |
| 68 | Instrument Calibration Technique for Pitch Standards by Laser Diffractometer | This document describes the calibration procedures for grating pitch by laser diffractometer. The system can currently provide the pitch calibration service from 280 nm to 10 μm. The diffractometer is composed of a He-Ne laser at 543 nm, a four- quadrant detector, a vibration isolation system, a precision rotating index table and optical lenses. The calibration is based on the diffraction principle by using Littrow configuration. The average of grating pitch is calculated by the laser wavelength and the Littrow’s angles. |
| 69 | Measurement System Validation Procedure for Pitch Standard by Laser Diffractometer | This document describes the uncertainty evaluation for measurement of grating pitch specimens by laser diffractometer in Center for Measurement Standards. The system can currently provide the pitch calibration service from 280 nm to 10 μm. The diffractometer is composed of a He-Ne laser at 543 nm, a four- quadrant detector, a vibration isolation system, a precision rotating index table and optical lenses. The calibration is based on the diffraction principle by using Littrow configuration. The average grating is calculated by the laser wavelength and the Littrow’s angles. The analysis of measurement uncertainty is based on the ISO “Guide to the expression of uncertainty in measurement”. The error sources are considered and evaluated. |
| 70 | Instrument Calibration Technique for Nanoparticle Size Calibration -Dynamic Light Scattering | This document describes the calibration procedures for nanoparticle size characterization by dynamic light scattering (DLS) technique at the National Measurement Laboratory (NML). The measurement system is based on Zetasizer Nano ZS analyzer and belongs to Nanoparticle Size Measurement System (D26). Measurement instrument was manufactured by Malvern Instruments, UK and can currently provide the particles size calibration service from 20 nm to 1000 nm. The measurement system utilizes the Stoke-Einstein equation for particulate materials in Brownian motion to calibrate particle hydrodynamic diameter. ‧Calibration item : Particle Size Standards – Polystyrene Sphere (also called Poly-Styrene Latex, PSL) (Standard Particle) ‧Measruand : Particle Size ‧Parameter : Particle Hydrodynamic Diameter ‧Measurement range of particles diameter : 20 nm to 1000 nm ‧Expanded uncertainty : Ux=20 nm = 0.8 nm, cover factor k = 2.00. U20 nm＜x≦50 nm = 1.8 nm, cover factor k = 2.00. U50 nm＜x≦100 nm = 3.3 nm, cover factor k = 2.00. U100 nm＜x≦200 nm = 6.4 nm, cover factor k = 2.00. U200 nm＜x≦300 nm = 9.9 nm, cover factor k = 2.01. U300 nm＜x≦500 nm = 17 nm, cover factor k = 2.00. U500 nm＜x≦800 nm = 26 nm, cover factor k = 2.01. U800 nm＜x≦1000 nm = 34 nm, cover factor k = 2.01. where x is the particle hydrodynamic diameter. ‧Confidence level : 95 ％. |
| 71 | Measurement System Validation Procedure for Nanoparticle Size – Dynamic Light Scattering | This document describes the uncertainty evaluation of nanoparticles size calibration system characterized by Laser Dynamic Light Scattering. This measurement system is belong to Nanoparticle Size Measurement System (D26). Zetasizer Nano ZS analyzer (Malvern Instruments) is used for particle hydrodynamic diameter calibration service with a diameter range from 20 nm to 1000 nm. The measurement system calibrates size of colloidal nanoparticles is based on the Stoke-Einstein equation and Brownian motion. Uncertainties analysis of measurement results are according to ISO/IEC Guide 98-3:2008. The uncertainty sources caused by measuring the nanoparticles diameter specimens are considered and evaluated. After a practical evaluation of uncertainty, this measurement system currently provides the following capability. ‧ Calibration item: Particle Size Standards -Polystyrene Sphere (also called Poly-Styrene Latex, PSL) (Standard Particle) ‧Measruand : Particle Size ‧Parameter : Particle Hydrodynamic Diameter ‧Measurement range of Particles Diameter : 20 nm to 1000 nm ‧Expanded uncertainty : Ux=20 nm = 0.8 nm, cover factor k = 2.00. U20 nm＜x≦50 nm = 1.8 nm, cover factor k = 2.00. U50 nm＜x≦100 nm = 3.3 nm, cover factor k = 2.00. U100 nm＜x≦200 nm = 6.4 nm, cover factor k = 2.00. U200 nm＜x≦300 nm = 9.9 nm, cover factor k = 2.01. U300 nm＜x≦500 nm = 17 nm, cover factor k = 2.00. U500 nm＜x≦800 nm = 26 nm, cover factor k = 2.01. U800 nm＜x≦1000 nm = 34 nm, cover factor k = 2.01. where x is the particle hydrodynamic diameter. ‧Confidence level : 95 ％. |
| 72 | Measurement System Validation Procedure for Thin Film Calibration by X-Ray Reflector | The uncertainty evaluation of thin film thickness calibrations was described in this document for D22 system. The system can currently provide the calibration service of SiO2, HfO2 and Al2O3 thin film thickness from 1.5 nm to 200 nm. A Gazing Incident X-Ray Reflector (GIXRR) was used to characterize thickness of the thin film in this system. The measurement system includes an x-ray tube, a goniometer, collimators, and a detector. An x-ray beam is incident on the surface of the thin films at grazing angle to obtain the total external reflection. Above the grazing angle, the intensity received by the detector will drop sharply. For a thin film structure, the“Kiessig Fringe,” an interference pattern generated by the layer structure, will be observed from the intensity recorded by the detector. According the fringes, the film thickness can be calculated and determined. The uncertainty analysis of measurement results is based on ISO/IEC Guide 98-3:2008. The error sources caused by measuring the thin film specimens are considered and evaluated. The measurement system currently provides the following capability: Subject of calibration : thin film thickness Range of SiO2, HfO2 and Al2O3 thin film thickness calibration : 1.5 nm to 200 nm Expanded uncertainty : 0.02 nm Confidence level : 95 ％ Coverage factor : 2.07 Effective degrees of freedom : 22 This document is part of thin film measurement system (D22). |
| 73 | Instrument Calibration Technique for Thin Film Calibration by X-Ray Reflector | The Calibration Measurement Procedure describes the methods used to calibrate the thickness standard of thin films by the PANalytical X’PERT PRO MRD (system code D22) at the Nano Mechanical Measurement Laboratory of NML (National Measurement Laboratory). The method is applied to the calibrations of thickness of SiO2, HfO2 and Al2O3 thin films. The measurement system currently provides the following capability: Subject of calibration : thin film thickness Range of SiO2, HfO2 and Al2O3 thin film thickness calibration : 1.5 nm to 200 nm Expanded uncertainty : 0.02 nm Confidence level : 95 ％ Coverage factor : 2.07 Effective degrees of freedom : 22 |
| 74 | Measurement System Validation Procedure for Nanoparticle Size by Calibration-System by Electro-Gravitational Aerosol Balance | This document describes the uncertainty evaluation of nanoparticle characterized using the Electro-gravitational Aerosol Balance (EAB). The primary standard of particle size ranging from 100 nm to 500 nm in number mean diameter using the electro- gravitational aerosol balance was developed in Center for Measurement Standards of Industrial Technology Research Institute. The particles certified by the standard system are used as size standards to calibrate various types of nanoparticle size measurement instruments. This system is attached to the Nanoparticle Size Measurement System and its code is D26. The uncertainty analysis of measurement results is based on ISO/IEC Guide 98-3:2008. The error sources from the measurement instruments and process are considered and evaluated. After a practical evaluation of uncertainty, the existing measuring system provides the following capability. ‧ Calibration item: Particle Size Standards (Polystyrene) ‧ Measuring range: 100 nm to 500 nm. ‧ Expanded uncertainty: 2.1 nm ‧ Confidence level: 95 ％ ‧ Coverage factor: 2.01 |
| 75 | Instrument Calibration Technique for Nanoparticle Size by Electro-Gravitational Aerosol Balance | This document describes the calibration procedures for nanoparticle size characterized using the Electro-gravitational Aerosol Balance (EAB). The particles certified by the standard system are used as size standards to calibrate various types of nanoparticle size measurement instruments. The primary standard of particle size ranging from 100 nm to 500 nm in number mean diameter using the electro- gravitational aerosol balance was developed in Center for Measurement Standards of Industrial Technology Research Institute. The particles certified by the standard system are used as size standards to calibrate various types of nanoparticle size measurement instruments. This system is attached to the Nanoparticle Size Measurement System and its code is D26. The uncertainty analysis of measurement results is based on ISO/IEC Guide 98-3:2008. The error sources from the measurement instruments and process are considered and evaluated. After a practical evaluation of uncertainty, the existing measuring system provides the following capability. ‧ Calibration item: Particle Size Standards (Polystyrene) ‧ Measuring range: 100 nm to 500 nm. ‧ Expanded uncertainty: 2.1 nm ‧ Confidence level: 95 ％ ‧ Coverage factor: 2.01 |
| 76 | Measurement System Validation Procedure for Scanning Electron Microscope System-Pitch Standard | This document describes uncertainty evaluation of standard pitch calibrated by Scanning Electron Microscope (SEM), which is belong to Scanning Electron Microscope Calibration System (D28). The calibration covers pitch range from 70 nm to 1000 nm. The uncertainty analysis of the calibration is based on “ISO/IEC Guide 98-3:2008, Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)”. |
| 77 | Instrument Calibration Technique for Scanning Electron Microscope Measurement System-Pitch Standard | This document describes the uncertainty evaluation of standard pitch calibration by Scanning Electron Microscope (SEM). The calibration system is belonging to Scanning Electron Microscope Calibration System (D28). The system will provide pitch calibration from 70 nm to 1000 nm.The uncertainty analysis of measurement results is based on “Guide to the expression of uncertainty in measurement”, ISO/IEC 98-3:2008. The measurement system currently provides the following capability. |
| 78 | Instrument Calibration Technique for Scanning Electron Microscope System - Standard Particle Size | This document describes the calibration procedure of standard nanoparticle size calibration by Scanning Electron Microscope (SEM). The calibration system belongs to the Scanning Electron Microscope Calibration System (D28). The system will provide nanoparticle calibration from 10 nm to 60 nm. The uncertainty analysis of measurement results is based on “ISO/IEC Guide 98-3:2008, Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)”. The measurement system currently provides the following capability. Calibration item: Particle size of particle standard. l Calibration item: Particle size of particle standard. l Measurement range:10 nm to 60 nm l Expanded uncertainty: 10 nm ≦ particle size ＜ 30 nm: 1.5 nm 30 nm ≦ particle size ≦ 60 nm: 5.4 nm l Confidence level: 95 ％ l Coverage factor k：2 |
| 79 | Measurement System Validation Procedure for Scanning Eletron Microscopy System -Standard Particle Size | This document describes the uncertainty evaluation of standard nanoparticle size calibration by Scanning Electron Microscopy (SEM). The calibration system belongs to the Scanning Electron Microscope Measurement System (D28). The system will provide nanoparticle size calibration from 10 nm to 60 nm. The uncertainty analysis of measurement results is based on “ISO/IEC Guide 98-3:2008, Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)”. The calibration and measurement capabilities of this calibration system are: Calibration item: Particle size of particle standard. l Calibration item: Particle size of particle standard. l Measurement range: from 10 nm to 60 nm l Expanded uncertainty: 10 nm ≦ particle size ＜ 30 nm: 1.5 nm 30 nm ≦ particle size ≦ 60 nm: 5.4 nm l Confidence level: 95 ％ l Coverage factor k：2 |
| 80 | Measurement System Validation Procedure for Nano Particle Functional Property Measurement System – Calibration of Specific Surface Area by Gas Adsorption BET Method | This document describes the calibration procedures to calibrate the specific surface area of the standard particles according to the physical gas adsorption behavior with BET (Brunauer-Emmett-Teller) method. The calibration system belongs to Nano Particle Functional Property Measurement System (system code D27) with the measuring instrument ASAP 2020 analyzer manufactured by Micromeritics, USA. It provides an ideal calibration approach for measuring specific surface area of standard nanoparticles within 3 m2/g to 600 m2/g. The uncertainty analysis of measurement system is based on ISO/IEC Guide 98-3:2008. All uncertainty sources occurred from the measurement instruments and process are considered and evaluated essentially. The measurement system currently provides the following measurement capabilities. ‧ Calibration item: specific surface area of standard particle (gas adsorption – BET method) ‧ Measurement range: 3 m2/g to 600 m2/g ‧ Relative expanded uncertainty: 1.6 ％ (3 m2/g to 100 m2/g) Relative expanded uncertainty: 2.1 ％ (＞ 100 m2/g to 600 m2/g) ‧ Confidence level: 95 ％ ‧ Coverage factor: 2.14 (3 m2/g to 100 m2/g) Coverage factor: 2.13 (＞ 100 m2/g to 600 m2/g) |
| 81 | Instrument Calibration Technique for Nano Particle Functional Property Measurement System – Calibration of Specific Surface Area by Gas Adsorption BET Method | This document describes the calibration procedures to calibrate the specific surface area of the standard particles according to the physical gas adsorption behavior with BET (Brunauer-Emmett-Teller) method. The calibration system belongs to Nano Particle Functional Property Measurement System (system code D27) with the measuring instrument ASAP 2020 analyzer manufactured by Micromeritics, USA. It provides an ideal calibration approach for measuring specific surface area of standard nanoparticles within 3 m2/g to 600 m2/g. The BET method is applicable only to adsorption isotherms of type II (nonporous or macroporous solids, pore with width greater than approximately 50 nm) and type IV (mesoporous solids, pore diameter between 2 nm and 50 nm). |
| 82 | Instrument Calibration Technique for Pitch Standard Calibration System by Metrological AFM | This document describes the calibration procedures for measuring pitch reference standard at National Measurement Laboratory (NML). This system can provide the pitch calibration service from 50 nm to 5 um. The pitch measurement system consists of the X- and Y-axis laser interferometers, precision stage and atomic force microscope (AFM). The pitch reference standard is put on precision stage, which is controlled by a LabVIEW program and the calibrated displacement in both X- and Y-axis is measured by the laser interferometers. The AFM provides the tip scanning on sample surface in Z-axis corresponding to the movement in XY stage. With the X- and Y axis displacement obtained by laser interferometers and the Z-axis displacement measured by AFM, the topography of the pitch standard can be assessed. This measurement system currently provides the following capability. Calibration item: Line pitch standards Measurement range of pitch: 50 nm to 5 um Maximum scan size: 55 μm * 55 um This calibration system belongs to Pitch Standards Calibration System (D19) |
| 83 | Measurement System Validation Procedure for Pitch Standard Calibration system by Metrological AFM | This document describes the uncertainty evaluation for measuring pitch reference standard at National Measurement Laboratory (NML). This system can currently provide the pitch calibration service from 50 nm to 5 μm. The pitch measurement system consists of X- and Y-axis laser interferometers, precision stage and atomic force microscope (AFM). The pitch reference standard is put on precision stage and scanned by the tip of AFM. During calibration, the tip of AFM does not move. Instead, the precision stage is moved and controlled by a LabVIEW program. The pitch reference standard is then scanned by the tip. The laser interferometers record the displacements of stage in X and Y directions, and the capacitive sensor inside the AFM records the vertical displacement of tip. The uncertainty analysis of measurement system is based on ISO/IEC Guide 98-3:2008. The uncertainty sources from the measurement instruments and process are considered and evaluated. This measurement system currently provides the following measurement capabilities. ‧ Calibration item: Line pitch standards. ‧ Measuring range of pitch: 50 nm to 5 μm. ‧ Maximum scan size: 55 μm × 55 μm ‧ Expanded uncertainty: 0.17 nm ‧ Coverage factor: 1.97 ‧ Confidence level: 95 ％ ‧ Effective degrees of freedom: 492 This calibration system belongs to Pitch Standards Calibration System (D19). |
| 84 | Development of Analytical Techniques for Particle Impurities in Isopropyl Alcohol | The primary goal of this project is to develop and optimize the DMA-CPC system, enabling more effective differentiation of the quality of various batches of high-purity isopropyl alcohol (IPA), thereby assisting Tokuyama Corp. in enhancing the competitiveness of its electronic-grade IPA products. During the execution of the project, the team effectively utilized quality tools such as QFD, SWOT, PDCA, FMEA, Gantt charts, WBS, ARCI, fishbone diagrams, and the seven new QC tools to carry out experimental design, process control, and problem-solving. Ultimately, the system’s sensitivity was optimized and improved by several hundredfold. The project successfully developed the system, which has been highly praised by the company, and further collaboration will continue in the next phase of the project. |
| 85 | Standard inspection process of 3D X-ray computed tomography measurement system. | This document of standard operation procedure is the operational guide for 3D X-ray CT measurement system. It comprises preliminary operation, test steps, post test and shutdown procedure, data analysis, and example of test report. |
| 86 | XCT measurement uncertainty analysis report | uncertainty |
| 87 | Calibration Experiment Design Report | X-ray computed tomography (XCT) technology has been widely used in industrial measurement or inspection, and its measurement results are affected by many factors. In order to have a measurement traceability, it is necessary to provide relevant measurement uncertainty for the measured dimensions. This article details the calibration process of XCT system, preparations item, calibration steps, steps after completing the calibration, data analysis method and calibration report format. |
| 88 | XCT system calibration procedure and uncertainty evaluation report | X-ray computed tomography (XCT) technology has been widely used in industrial measurement or inspection, and its measurement results are affected by many factors. In order to have a measurement traceability, it is necessary to provide relevant measurement uncertainty for the measured dimensions. This article details the calibration process, preparations, calibration steps, steps after completing the calibration, data analysis and calibration report of the XCT system. |
| 89 | Instrument Calibration Technique for Gas Measurement System-Gas Monitor | This report describes the methods used to calibrate various gas monitors by standard gas and gas divider, which can divide standard gas into different concentration. The contents include: requirement of calibration apparatus, calibration steps, preparation before calibration, and format of calibration report. Each category is specified sequentially in this document. |
| 90 | Measurement System Validation Procedure for Gas Measurement System-Gas Monitor | This measurement system validation procedure is part of the gas measurement system.This measurement system validation procedure evaluates the uncertainty of gas monitor calibration. The required standard gas is produce by gas divider. This gas is then measured by the gas monitor being calibrated, allowing comparative calibration to be performed. The system apparatus requirement and the measurement principles are being mentioned in this document. The transfer and analysis of the uncertainty are also described. |
| 91 | Instrument Calibration Technique for Isotope Ratio- Mass Spectrometry | This calibration procedure is provided for the operation of multicollector inductively coupled plasma mass spectrometer (MC-ICP-MS) to measure silicon isotope ratio, belonging to Isotope Ratio Measurement System (C14) in National Measurement Laboratory (NML). An appropriate concentration of silicon solution (0.5 mg/kg to 50 mg/kg) having a purity of greater than 99.9 ％ is introduced into MC-ICP-MS where the three silicon isotope signals (28Si, 29Si, 30Si) can be simultaneously detected with three individual signal receptors. In this way, a precise silicon isotope ratio can be obtained. |
| 92 | Measurement System Validation Procedure for Isotope Ratio Analyzer - Mass Spectrometry | This measurement system validation procedure is provided to Isotope Ratio Measurement System (C14) in National Measurement Laboratory (NML). This document states the evaluation of the uncertainty of the measured silicon isotope ratios, as the reference for laboratory colleagues to process the calibration service. In according to the measurement equations, the evaluation items of the uncertainty source include: 1) the uncertainty of the true value of the isotope ratio of the standard material; 2) the uncertainty of isotope ratio measurement process of the standard material; 3) the uncertainty of isotope ratio measurement process of the calibrated material. The announced service range and corresponding expanded uncertainty, shown as the table below, are used as a reference for the industry to apply for a measurement service. |
| 93 | The standard operation procedure of determining the isotope ratios of inorganics in solutions | Multicollector inductively coupled plasma mass spectrometer (MC-ICP-MS) is utilized to detect the inorganic isotopes in solutions to determine the individual inorganic isotope ratios. In this method, the inorganic isotope standards from National Measurement Institutes (NMIs) are used as the standard material to evaluate different data correction methods. The isotope ratio obtained from the standard is applied to correct the corresponding isotope ratio of analyte. This document describes the standard operation procedure and related quality assurance and quality control (QA/QC) process for the inorganic isotope ratio measurement. The feasibility of applying this method to forensic science is under development. |
| 94 | Establishment of push warning messages system of check standard for geometric error measurement | A domestically produced optical non-contact three-axis displacement sensing system is used to obtain the rotation axis center error measurement, and is combined with the third-party communication function of the controller to automatically compensate the compensation value. The communication method with the controller is OPCUA (OPC Unified Architecture), which is internationally accepted. Format. Search the manual information provided by the controller manufacturer for the position of the rotation center compensation error compensation parameter (controller: Siemens, cooperate with the measurement center), upload the rotation center error compensation through the computer network, and search for the most suitable function node according to the function description , its application software development programming language is mainly written in Visual studio C＃. New functions have been added to the existing controller connection transmission software of the measurement center, including: reading and writing rotation center error compensation values, judgment threshold setting fields and message push functions; push warning messages The broadcast uses public free communication software Line. This commission is mainly to establish an intelligent online measurement standard, complete the online measurement standard for spatial geometry of five-axis machine tools, and improve the long-term utility online measurement capabilities. |
| 95 | PMC interim report of intellectual machinery industry technology promotion and services | Through the understanding from production capabilities of machine tool and related components industry and the summaries from our experts and advises from delegated manufacturers, PMC analyzes multinational industrial tendencies and Taiwan related components manufacturers’ production capabilities. PMC also investigates possible tendency projects for machine tool and related components industry to set up programs for technology applications and developing strategies, meanwhile connects public corporations and every manufacturer through consultations in addition to promoting online technology of metrology and measurement standards. |
| 96 | CNFI interim report of intellectual machinery industry technology promotion and services | To comply promotion of measurement and metrology laboratory in intellectual machinery industry updated technology to domestic related corporations. |
| 97 | Establishment of push warning messages system of check standard for geometric error measurement | A domestically produced optical non-contact three-axis displacement sensing system is used to obtain the rotation axis center error measurement, and is combined with the third-party communication function of the controller to automatically compensate the compensation value. The communication method with the controller is OPCUA (OPC Unified Architecture), which is internationally accepted. Format. Search the manual information provided by the controller manufacturer for the position of the rotation center compensation error compensation parameter (controller: Siemens, cooperate with the measurement center), upload the rotation center error compensation through the computer network, and search for the most suitable function node according to the function description , its application software development programming language is mainly written in Visual studio C＃. New functions have been added to the existing controller connection transmission software of the measurement center, including: reading and writing rotation center error compensation values, judgment threshold setting fields and message push functions; push warning messages The broadcast uses public free communication software Line. This commission is mainly to establish an intelligent online measurement standard, complete the online measurement standard for spatial geometry of five-axis machine tools, and improve the long-term quality online measurement capabilities. |
| 98 | PMC final report of intellectual machinery industry technology promotion and services | Through the understanding from production capabilities of machine tool and related components industry and the summaries from our experts and advises from delegated manufacturers, PMC analyzes multinational industrial tendencies and Taiwan related components manufacturers’ production capabilities. PMC also investigates possible tendency projects for machine tool and related components industry to set up programs for technology applications and developing strategies, meanwhile connects public corporations and every manufacturer through consultations in addition to promoting online technology of metrology and measurement standards. |
| 99 | CNFI final report of intellectual machinery industry technology promotion and services | To comply promotion of measurement and metrology laboratory in intellectual machinery industry updated technology to domestic related corporations. |
| 100 | Procedure of Measurement and Uncertainty Evaluation for Effective Area of the Bell Prover | The Bell Prover, part of the Low Pressure Gas Flow Calibration System - Bell Provers (system code F08), is designed with a precisely manufactured stainless steel bell submerged in a sealed oil tank. It uses each independent photo sensor and selector switch to set different standard volumes required for calibration. The bell is very precisely machined, with a highly uniform cross-sectional area. The flow calibration uses the volume of the intake gas, which is calculated by multiplying the effective cross-sectional area of the bell’s inner wall by the displacement of the bell during calibration. Before performing the calibration, it is necessary to use measurement instruments, including a π tape, laser interferometer, depth micrometer, and digital caliper, to measure the effective cross-sectional area of the bell to determine its volume. According to the measurement uncertainty evaluation method recommended by ISO/IEC Guide 98-3:2008, the uncertainty of the effective cross-sectional area of the bell is assessed. |
| 101 | Ultrasonic Gas Meter Type Approval Technology Verification Report (FY2024) | The government is currently promoting smart metering and integrating the communication formats for meter reading of three types of meters. Among them, for household gas meters, only the mode of using membrane gas meters with additional units is available, lacking the option of other gas meters. However, Japan had already developed household ultrasonic gas meters under government leadership 18 years ago, utilizing the latest technology and featuring electronic communication functions, ready to replace traditional membrane gas meters. This indicates that ultrasonic gas meters may become an option for future domestic smart metering applications. In response to this potential development need, this report conducts tests on ten test items specified in OIML R137-1＆2 for the type approval of ultrasonic gas meters, including meter error, reproducibility, repeatability, durability, overload flow testing, flow direction (forward/reverse flow), flow disturbance (installation effects), electromagnetic interference, electrostatic interference, and vibration. It also involves tasks such as conducting an inventory of ultrasonic gas meter testing technologies and drafting certification specifications in line with the statutory metrology plan for the year 113, to complete the formulation of certification standards for household ultrasonic gas meters. |
| 102 | Draft Technical Specification for Ultrasonic Gas Meters Type Approval (CNPA 137-1 Version 1) | This standard applies to household ultrasonic gas meters for measuring natural gas (NG) and liquefied petroleum gas (LPG), which calculate flow velocity by measuring the time difference between the transmission and reception of ultrasonic waves in the direction of flow and reverse flow, then multiply the flow velocity with the cross sectional area of the conduit to obtain the flow rate, and finally integrate the flow rate with respect to time to obtain the accumulated volume. It also includes (electronic) devices attached to the gas meter that affect its metering performance. The accuracy class of the ultrasonic gas meter is 1.0 class and 1.5 class, with a maximum working pressure (gauge pressure) of 10 kPa or less, a maximum flow rate of 16 m3/h, a maximum working environmental temperature range of -5℃ ~ 55℃, and battery power supply. |
| 103 | Instrument Calibration Technique for Ionization Gauge | The calibration procedure can be used as a basis for calibrating vacuum gauge in National Measurement Laboratory, NML. Direct comparison method is used for gauge ranging from ultrahigh vacuum to high vacuum. Primary preparation, calibration steps, data analysis, post-calibration procedure and example of calibration report are described in this procedure. The measurement range is from 5 × 10-6 Pa to 1 Pa (5 × 10-8 mbar to 1 × 10-2 mbar). |
| 104 | Instrument Calibration Technique for 500 N Deadweight Force Standard Machine | The document of “Instrument Calibration Technique for 500 N Deadweight standard machine” (system code: N09) is described preparations, calibration procedure, post-calibration, data analysis and calibration report during the measurement process. The measurement scope is under 500 N. The calibrated items are including proving ring, force transducer, dynamometer and force gauge. The documentation also could be the reference and training guide for the persons to perform the calibration work on this machine. |
| 105 | Instrument Calibration Technique for the Low-Capacity Mass Weighing System-Direct Comparison Method | This procedure provides the laboratory colleague as reference to weigh 1 mg, 2 mg, 5 mg, 10 mg, 20 mg, 50 mg, 100 mg, 200 mg, 500 mg, 1 g, 2 g, 5 g, 10 g, 20 g, 50 g, 100 g, 200 g, 500 g and 1 kg weights. In practical weighing, double substitution method is used to do the mass comparison of weights. Controlling the load alternator by computer during weighing, the readings of the weights (weights combination) at each position can be obtained from the readout of display. After several weighing, the differences of weights, the mean deviation and the standard deviation can be calculated out, and then the mass value and uncertainty of the unknown weight can also be calculated out from the values of standard weight. |
| 106 | Instrument Calibration Technique for High capacity Mass Weighing System — Direct Comparison Method | This procedure provides the laboratory colleague as reference to weigh 2 kg, 5 kg, 10 kg, 20 kg and 50 kg. Double substitution method is applied to perform the mass comparisons of weights. During weighing, the readings of the standard and unknown weights can be obtained. After several weighing, the differences between the standard and unknown weights, the mean deviations and the standard deviation can be calculated, and then the mass values and uncertainty of the unknown weights can also be calculated from the value of standard weight. |
| 107 | Measurement System Validation Procedure for the High－capacity Mass Weighing System－Direct Comparison Method | This procedure provides laboratory colleagues a reference for evaluating the uncertainty when performing mass calibrations of weights of 2 kg, 5 kg, 10 kg, 20 kg and 50 kg. In practical weighing, the double substitution method is adopted to perform the mass comparison of 2 kg, 5 kg, 10 kg, 20 kg and 50 kg weights. During weighing, the readings of the weighting can be obtained and the mean value and standard deviation can be calculated out by computer, the mass value and uncertainty of the unknown weight can be calculated out from the values of standard weight. Measurement scope of the system: 2 kg, 5 kg, 10 kg, 20 kg and 50 kg. The system belongs to the Mass Weighing System (M03). |
| 108 | Instrument Calibration Technique for Torque Calibration System - Torque Transducer | This document describes the operation procedures to calibrate torque transducers by using the Torque Calibration System (system code: N12). It described the preparation, calibration procedure, post-calibration procedure, data analysis and calibration report during the measurement process. The measurement range is from 50 N m to 5 kN m. |
| 109 | Measurement System Validation Procedure for Torque Calibration System – Torque Transducer | Uncertainty evaluations for the 5 kNm torque calibration system are described in the document. The main purpose of this system is to maintain 5 kNm reference standard, and transfer it to secondary standard .We adopt the method suggested in ISO/IEC Guide 98-3 : 2008 to evaluate the uncertainty of this system. We also design a measurement assurance program to insure the system’s stabilization and reliability. |
| 110 | Spindle Preload Force Sensor Verification Report | The measurement principle of the spindle preload force sensor, which is supposed to be developed this year, is to improve the outer spacer of the spindle bearing by adding force sensing elements to achieve the goal of preload measurement, ultimately integrating it into a commercial spindle. The specifications of the sensor have already been confirmed to meet the planned requirements. To ensure that the sensor can effectively measure the preload after being integrated into the spindle, three sets of Wheatstone bridge output voltage and applied force fitting curves have been established. Based on these fitting curves, the preload measurement data can be directly read. This report details the integration of the sensor into the spindle and the preliminary test results after integration is complete. |
| 111 | Test Measurement and Data Analysis Report of Preload Force Sensor | The measurement principle of the preload force sensor to be developed in this research is based on improving the bearing’s outer ring and washer inside the spindle by integrating force sensing components, thus achieving the goal of preload force measurement. The sensor will ultimately be integrated into commercial spindles. After evaluating the performance of the sensor, it has been successfully installed in a commercial spindle for testing. The spindle assembly and preload force measurement during low and high-speed operation have been completed. According to the current measurement results, the sensor can accurately measure the preload force at spindle speeds below 20,000 rpm and can continuously measure for up to 1 hour at 20,000 rpm. This report explains the measurement principle, structure, and analysis of the measurement data for the sensor integrated with the spindle. |
| 112 | Attendance Reports of BIMU 2024 and PTB | This report aims to explore the experience of visiting BIMU 2024 in Milan, Italy and PTB in Braunschweig, Germany, and to elucidate the gains, benefits, and suggestions from this trip. |
| 113 | Instrument Calibration Technique for Roundness Standard | The document describes the calibration procedure of the roundness measuring system for the National Measurement Laboratory. In this document, a FEDERAL FORMSCAN 3000 rotary table type roundness measuring instrument is used. Profile of the customer artifact that rotate along a spindle is measured by an electro-mechanical probe. Out-of roundness can be obtained by the least square circle method to separate the spindle error. This calibration system is attached to the Roundness Calibration System (System code: D12), Measuring range： Roundness standard : (0~2)μm (out-of-roundness) For 95﹪confidence level, coverage factor k =2.01, Expanded uncertainty(U) =0.021 μm. |
| 114 | Measurement System Validation Procedure for Roundness Measurement System | This document is the evaluation report of roundness measuring system of National Measurement Laboratory. The roundness measuring instrument is FEDERAL FORMSCAN 3000 type which consists of a high precision turntable and a mechanical electronic gage probe to grab the radial deviation of workpiece. The least squares analysis and separating spindle error methods have been used to calculate the roundness of the workpiece and the spindle error (the roundness of spindle). In the Quality Assurance Model of the instrument the spindle error (the roundness of spindle) is process parameters to check the stability of calibration procedure. After long-term stacking the data of process parameter, we have evaluated the capacity of roundness calibration and the measuring uncertainty as follows： Measuring range： Roundness standard：(0～2 ) μm (out-of-roundness) For 95 ％ confidence level, coverage factor k ＝ 2.01 Expanded uncertainty = 0.021 μm This document belongs to roundness calibration system (D12). |
| 115 | Instrument Calibration Technique for Surface Roughness Standard Specimen | This document describes the National Measurement Laboratory regular or nonregular roughness calibration procedures. This calibration procedures is suitable for samples with flat surfaces, with lengths less than 200 mm, and roughness parameter Ra, Rq between 0.01 μm and 20 μm, Rmax, Rt, Rz between 0.01 μm and 80 μm. |
| 116 | Instrument Calibration Technique for Angle Blocks | This document describes the calibration procedures for angle blocks with nominal angles from 1" ~ 45° at National measurement Laboratory. The angle blocks to be calibrated are compared with the reference angle blocks by using two autocollimators. The required equipment for this calibration is also stated. An example of calibration report is given. This calibration system is attached to the Angle Blocks Calibration System (System code: D06). |
| 117 | Measurement System Validation Procedure for Angle Blocks | This document states the uncertainty evaluation procedures for the angle blocks calibration system. The angle blocks to be calibrated are compared with the reference angle blocks by using two autocollimators. The effects of the influential factors on this calibration system will be considered to estimate the uncertainty according to the ISO "Guide to the Expression of Uncertainty in Measurement^, hereinafter called ISO GUM. The confidence level of this system is 95﹪. Control charts are developed, in accordance with the NBS SP-676-II, to monitor the stability of this system. This calibration system is attached to the Angle Blocks Calibration System (System code: D06). |
| 118 | Instrument Calibration Technique for Electronic Level | This document describes the calibration procedures for electronic level. Deviations of the angle of electronic levels are measured by small angle generator. These calibrations provided mainly focus on the range of ± 1°. This calibration system is attached to the Small Angle Calibration System (System code: D08). |
| 119 | Instrument Calibration Technique for the Geodetic Length Measuring Instruments | This document is the calibration procedure on the calibration system of the Geodetic Length Measuring Instruments (system code：D14) for carrying out the National Measurement Laboratory’s Project. The Total Stations and the Electronic Distance-Measuring Instruments (EDMIs) are conducted at the National Standard Baseline for calibration services. The main contents in this document are below. 1. Describe how to get the standard baseline distances of Dr as a basis of calibration by using the ME5000 unit. 2. Set up the calibrated EDMIs on the pillars of the National Standard Baseline for measuring the distances of 18 baselines under the correct operation and settings. 3. Analyze the calibration results for providing the corrected additive constant and the corrected scale constant, respectively. The example of the calibration report is shown in the text. |
| 120 | Measurement System Validation Procedure for Line Scale Standards | This document is an assessment report on the calibration system of the standard scale. The standard calibrated scales shall be grade 0 (CNS 7870-B6049) with 0.01 mm to 1000 mm in length. The uncertainty and analysis of measurement results are based on "ISO/IEC Guide 98-3:2008, Uncertainty of measurement - Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)". The error sources caused by measuring the line scales are considered and evaluated. |
| 121 | Instrument Calibration Technique for Line Scale Standards | This document describes the calibration procedures for the standard scale of different materials (ex. steel, glass…)of grade 0 (CNS 7870-B6049) with lengths 0.1 to 1000 mm. The calibration system developed by the National Measurement Laboratory was composed by a MOORE M-48X single axis instrument to position the graduation and a PZT-drive fine adjustment table with CCD camera to fine position the graduation. |
| 122 | Measurement System Validation Procedure for the Calibration of Geodetic Angle Measuring Instruments | This document is applied to the calibration system of geodetic angle measuring instruments (system code: D15) on the National Measurement Laboratory (NML). The total stations and the electronic and optical theodolites are calibrated by using the Orthogonal Coordinate Measurement System (OCMS) for services. The error of horizontal angle of μ as one set is a main index for evaluating the accuracy of theodolites. The Orthogonal Coordinate Measurement System (OCMS) is used for carrying out the calibration. The 360 feeth of the ULTRADEX indexing table mounted on the OCMS is taken as a working standard for anglar measurement. The checking parameters and their control charts have been designed for monitoring the stability of the system. The uncertainty of horizontal angle of μ as one set is evaluated in accordance with the ISO/IEC Guide 98-3:2008. Besides, the errors of collimation axis and horizontal axis of telescope of electronic circle are also provided for user’s reference to check and adjust. |
| 123 | Instrument Calibration Technique for Long Gauge Block - Using Universal Measuring Machine | The document describes the methods used to calibrate long gauge blocks by the universal measurement machine at National Measurement Laboratory. It is applied to grade 0(and above) with the following length of gauge blocks – 125 mm, 150 mm, 175 mm, 200 mm, 250 mm, 300 mm, 400 mm, 500 mm and 600 mm, respectively. The shape of the end surface of the gauge blocks must be rectangular. The method applies to the calibration of long gauge blocks by comparison. |
| 124 | Measurement System Validation Procedure for the Calibration of Geodetic Length-Measuring Instruments | This document is the assessment report on the calibration system of the Geodetic Length Measuring Instruments (system code: D14) for carrying out the National Measurement Laboratory’s Project. The Total Stations and the Electronic Distance-Measuring Instruments (EDMIs) are conducted at the National Standard Baseline for calibration services. The error sources in measurements and the uncertainties of the calibration differences of dD are evaluated. The checking parameters and the control charts for monitoring the calibration system have been designed in practices. The uncertainty of the calibration system is according to the ISO/IEC Guide 98-3:2008 published by the International Standards Organization (ISO). The expanded uncertainty of the calibration differences of dD at the level of confidence 95％, the coverage factor of k = 1.98, １１Resolution: 0.1 mm ((0.８ mm)^2 ＋ ( 0.4 × 10^-6 × L)^2)^0.5, L in distance, unit is m． ２Resolution: １.０ mm (( １.０mm)^2 ＋ ( 0.4 × 10^-6 × L)^2)^0.5, L in distance, unit is m． |
| 125 | Measurement System Validation Procedure for Roundness Standard -Rotating Pick-up Type | The document describes the uncertainty evaluation of the roundness measuring system for the National Measurement Laboratory. In this document, a Taylor Hobson TALYROND 73 HPR rotating pick-up type roundness measuring instrument is used. This calibration system is attached to the Roundness Calibration System (System code: D12), Measuring range：Roundness standard：(0.001～2 ) μm (out-of-roundness) For 95 ％ confidence level, coverage factor k ＝ 1.97 ~ 2.14, Expanded uncertainty(U) = Q[4.13,67R,2.14σ]nm, where R means the measurement of roundness with μm unit. σ means the value of standard deviation for multi-step measurements with nm unit. |
| 126 | Measurement System Validation Procedure for Calibrating Frequency Stabilized Lasers | The Measurement System Validation Procedure describes the method used to evaluate the uncertainty of the calibration system for frequency stabilized lasers at National Measurement Laboratory . This documentation is attached to frequency-stabilized laser system (system code: D16). This system measures the frequency difference between a frequency-stabilized laser with an iodine stabilized He-Ne laser by using the beat frequency technique. The frequency of a frequency-stabilized laser is equal to the frequency of an iodine stabilized laser, which is well known, plus or minus the frequency difference. The measurement scope and the uncertainties are shown as below. Measurement scope: Frequency 474 THz(wavelength 633 nm) frequency-stabilized lasers The best expanded uncertainty：13.8 kHz The best relative expanded uncertainty：2.92 x E-11 (95﹪confidence level and coverage factor k = 1.96) |
| 127 | Instrument Calibration Technique for Frequency Stabilized Lasers | The Instrument Calibration Technique describes the method used to calibrate frequency stabilized lasers by the iodine stabilized He-Ne lasers at National Measurement Laboratory . This documentation is attached to frequency-stabilized laser system (system code: D16). Laser frequency of stabilized lasers measured by beating with the primary standards will ensure traceability to the definition of metre. The measurement scope and the results of evaluated uncertainties are shown as below. Measurement scope: Frequency 474 THz(Wavelength 633 nm) frequency-stabilized lasers The best expanded uncertainty: 13.8 kHz The best relative expanded uncertainty: 2.92 x E-11 (95 confidence level and coverage factor k = 1.96) |
| 128 | Instrument Calibration Technique for Geodetic Angle Measuring Instruments | This document is the calibration procedure on the calibration system of the Geodetic Angle Measuring Instruments (system code: D15) for carrying out the National Measurement Laboratory (NML). The total stations and the electronic and optical theodolites are calibrated by using the Orthogonal Coordinate Measurement System (OCMS) for services. The document is as a basis for calibration. The main contents of the procedure are stated below. 1. Analyze the axis errors. 2. Calculate the error of the horizontal angle as one set and its expanded uncertainty. 3. Show the example of how to complete the calibration report (certificate). The calibration and measurement capability for the error of horizontal angle as one set, with the type A of standard uncertainty of 0.1", is estimated for 1.1". |
| 129 | Meaurement System Validation Procedure for Electronic Level | This document is a validation report for the calibration system which shall carry out electronic level measurements by a small angle generator. The effects of the influential factors on this calibration system will be considered to estimate the uncertainty according to the ISO “Guide to the Expression of Uncertainty in Measurement”. The calibration system provides the traceability and the calibration service of electronic level. This calibration system is attached to the Small Angle Calibration System (System code: D08). |
| 130 | Instrument Calibration Technique for Polygons | This document describes the calibration procedures for polygons with number of faces from 3 to 72. The required equipment for polygon calibration is also stated. The calibration method is based on the principle of "circle closure", i.e. the sum of all the interior angles of a complete circle equals to 360°. The mathematical model of polygon calibration is described. An example of the calibration report is also given. This calibration system is attached to the Large Angle Calibration System (System code: D07). |
| 131 | Measurement System Validation Procedurs for Polygons | This document states the uncertainty evaluation procedures for the Polygons Calibration System. By using autocollimators as the measurement standards and based on the principle of “circle closure”, the angular error of each interval of the polygon can be estimated by schematic diagram method. The effects of the influential factors on this calibration system will be considered to estimate the uncertainty according to the ISO “Guide to the Expression of Uncertainty in Measurement”, hereinafter called ISO GUM. The confidence level of this system is 95 ％. Control charts are developed, in accordance with the NBS SP-676-II, to monitor the stability of this system. According to the developed control charts, it shows that this system is stable. This calibration system is attached to the Large Angle Calibration System (System code: D07). |
| 132 | Measurement System Validation Procedure for Long Gauge Block -Using Universal Measuring Machine | This document describes the uncertainty evaluation of long gauge block calibration system by comparison at the National Measurement Laboratory (NML). It is applied to gauge blocks with the following length of long gauge blocks – 125 mm, 150 mm, 175 mm, 200 mm, 250 mm, 300 mm, 400 mm, 500 mm and 600 mm. The shape of the end surface of the long gauge blocks shall be rectangular. The evaluation method bases on the ISO/TEC Guide 98-3:2008. The factors of the error sources are considered to estimate the measurement uncertainty of this calibration system. |
| 133 | Measurement System Validation Procedure for Surface Roughness Standard Specimen | The document describes the uncertainty evaluation of measuring roughness specimens and belongs to surface roughness measurement system for the service of roughness calibration. The uncertainty and analysis of measurement results are based on "ISO/IEC Guide 98-3:2008, Uncertainty of measurement - Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)". The error sources caused by measuring the roughness specimens are considered and evaluated; therefore we can determine the uncertainty of this measuring system in roughness. |
| 134 | Instrument Calibration Technique for Environmental Sensors | This document is an assessment report on the calibration system of the environmental sensors by the Center for Measurement Standards in carrying out the National Measurement Laboratory’s Plan. The calibration system provides the traceability and the calibration service of temperature senor, humidity sensor and pressure sensor. |
| 135 | Measuremetn System Validation Procedure for Environmental Sensors | This document is an assessment report on the calibration system of the environmental sensors by the Center for Measurement Standards in carrying out the National Measurement Laboratory’s Plan. The calibration system provides the traceability and the calibration service of temperature senor,humidity sensor and pressure senosr. The error source analysis and uncertainties are according to the “Guide to the Expression of Uncertainty in Measurement” published by the International Organization for Standardization (ISO). |
| 136 | Instrument Calibration Technique for Laser Interferometer system | This document describes the technique for calibrating laser interferometers(LIs). A standard LI and a test LI simultaneously measure the displacement of a moving stage. The displacement range is from 0 to 10 m. Comparing the results measured by these two systems the error of the test LI is obtained. |
| 137 | Measurement System Validation Procedure for Laser Interferometer Calibration system | This document describes a system for calibrating laser interferometers system and the uncertainty analysis of measurement results. The analysis follows the rules of the ISO/TEC Guide 98-3:2008. After analyzing error sources, the capability of the calibration system and the uncertainty evaluation results are as follows. Instrument to be calibrated : laser interferometer system Displacement Range : (0 ~ 10) m Expanded uncertainty (test with air sensors )： 0.12 um~1.2 um。 the coverage factor k=2,which provides a confidence level of 95﹪ This document belongs to D18. |
| 138 | Instrument Calibration Technique for Setting Ring Gauge-Use of Labmaster Universal Measuring System | This report states about the calibration procedures of end standard of Ring gauges with 4 mm to 200 mm internal diameter. The calibration way is utilizing Labmaster universal measuring system to calibrate the length of internal diameter. First, the laser interferometer measured the standard Ring gauge for initial condition to reset, and then measured client’s Ring gauge directly. In this document, there were five subjects about the preparations, procedures, processing after calibration finishing, data analysis, and calibration reports. This document belongs to the D03 calibration system. |
| 139 | Measurement System Validation Procedure for Setting Ring Gauge-Use of Labmaster Universal Measuring System | This document was drafted about the uncertainty evaluation for the internal diameter calibration of end standard of ring gauges with the ranges of 4 mm to 200 mm. The calibration method is utilizing Labmaster universal measuring system, to calibrate the length of internal diameter. Firstly, the laser interferometer measured the 50 mm or other sizes standard ring gauge standard ring gauge for initial condition to reset. Then, it measured the ring gauge to be calibrated directly. The measurement uncertainty evaluation in this report was in accordance with the ISO/IEC Guide 98-3:2008 to provide the expanded uncertainty. |
| 140 | Instrument Calibration Technique for Indexing Table | This document describes the calibration procedures for indexing table. The required equipment for indexing table calibration is also stated. The calibration method is based on the principle of “circle closure”, i.e. the sum of all the interior angles of a complete circle equals to 360°. The mathematical model of polygon calibration is described. An example of the calibration report is also given. This calibration system is attached to the Large Angle Calibration System (System code: D07). |
| 141 | Measurement System Validation Procedure for Indexing Table | This document states the uncertainty evaluation procedures for the indexing table calibration system. The indexing table to be calibrated are compared with the master polygons by using one autocollimators. The effects of the influential factors on this calibration system will be considered to estimate the uncertainty according to the ISO "Guide to the Expression of Uncertainty in Measurement", hereinafter called the ISO GUM. The confidence level of this system is 95％ . Control charts are developed, in accordance with the NBS SP-676-II, to monitor the stability of this system. According to the control charts developed , it shows that this system is stable. Since there are three master polygons with 24-sided, 18-sided, and 12-sided, the angular intervals to be calibrated are 15°, 20°, and 30°, respectively. This calibration system is attached to the Large Angle Calibration System (System code: D07) . |
| 142 | Measurement System Validation Procedure of GNSS Static and Kinematic Positioning Calibration System | This document is an assessment report on the calibration system of the GNSS static and kinematic positioning by Center for Measurement Standards in carrying out the National Measurement Laboratory’s Project. The main purposes are to describe the error sources caused by proceeding the calibration of the GNSS receivers in the GNSS network and to analyze the uncertainties of the calibration system. The uncertainties of the calibration system are according to the "Guide to the Expression of Uncertainty in Measurement" published by the International Standards Organization (ISO). |
| 143 | Instrument Calibration Technique for GNSS Static and Kinematic Positioning Calibration System | This technical document describes the procedures for calibrating the GNSS receivers by using the GNSS ultra-short baselines calibration network (the distance is less than 100 m), and the precise GNSS positioning units. The document is the basis of carrying out the calibration of GNSS receivers. The main contents are as follows: 1.Illustrate the location of the network and explain the geocentric coordinates of the calibration points with respect to the IERS Terrestrial Reference Frame (ITRF). 2.Describe how to set up the GNSS receivers on the calibration points of the network and carry out the calibration procedures for them. 3.Analyze the positioning results of the GNSS receivers on the calibration points with the reference coordinates of the working standard. |
| 144 | Instrument Calibration Technique for Step Height Standard-Stylus Method | This document describes the CMS Laboratory regular or nonregular step height calibration procedures. The type of instrument for measurement is contact stylus and this calibration procedure is suitable for samples with flat surfaces with lengths less than 200 mm, and the nominal step or depth size between 0.01 μm and 50 μm. |
| 145 | Measurement System Validation Procedure for Step Height Measurement-Stylus Method | This document describes the uncertainty evaluation of measuring step hight or depth-setting specimens, and belongs to the step height measurement system for the service of step height calibration. The uncertainty and analysis of measurement results are based on "ISO/IEC Guide 98-3:2008, Uncertainty of measurement - Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)". The error sources caused by measuring the step height specimens are considered and evaluated; therefore we can determine the uncertainty of this measuring system in step height specimens whose lateral length is less than 200 mm and height (or depth) is between 0.01 μm and 50 μm. |
| 146 | Measurement System Validation Procedure for Step Height Standard-Optical Method | This document describes the uncertainty evaluation of measuring step height or depth-setting specimens, and belongs to the step height calibration system for the service of step height calibration. The uncertainty analysis of measurement results is based on "ISO/IEC Guide 98-3:2008, Uncertainty of measurement - Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)". The error sources caused by measuring the step height specimens are considered and evaluated. Our measuring system can currently provide the calibration service of the step height specimen whose lateral length is less than 120 mm, the measurement region larger than 700 μm and height (or depth) is between 0.01 μm and 100 μm. |
| 147 | Instrument Calibration Technique for Step Height Standard-Optical Method | This document describes the regular or nonregular step height calibration procedure in Dimensional Measurement Laboratory. The calibration procedure is suitable for the standard specimens with flat surface, the measurement region larger than 700 μm and the nominal step or depth size from 0.01 μm to 100 μm. Optical interferemetry is used in this procedure. |
| 148 | Instrument Calibration Technique for Long Gauge Block Standard-using Precision Long Gauge Block Calibration System) | This document describes the long gauge block calibration procedures by using laser interferometer at the National Measurement Laboratory (NML). The calibration range is from 100 mm to 1000 mm. The calibration capability is shown as follows. l Calibration item: long gauge block (Grade 0 or above, steel) l Measurement range: 100 mm ~ 1000 mm l Expanded uncertainty: [(71)2 ＋ (400*L)2]1/2 nm, L denotes the nominal size of long gauge block in m. l Coverage factor: 2.00 l Confidence level: 95 ％ This document belongs to Precision Long Gauge Block calibration system(D23). |
| 149 | Measurement System Validation Procedure for Long Gauge Block-using Precision Long Gauge Block Measurement Machine | This technique report is the uncertain evaluation basis of precision long gauge block calibration system in ITRI. It is applied to Long gauge blocks of a aleatoric size of lengths, the range 100 mm to 1000 mm, respectively. The shape on the end of the gauge blocks must be rectangular. The evaluation method bases on the ISO Guide to the Expression of Uncertainty in Measurement. All influential factors of the error sources are considered to estimate the integration uncertainty of this calibration system. After practical evaluation of Long Gauge Block uncertainty, our measurement system currently provides the following capability. ‧Calibration item : Long Gauge Block. ‧Measurement range : over 100 mm ~ 1000 mm. ‧Expanded uncertainty: {(71)2＋(400*L)2}1/2 nm, L in m. L means the nominal size of Long Gauge Block. ‧Confidence level：95﹪ |
| 150 | Instrument Calibration Technique for Plug Gauge Use of Labmaster Universal Measuring System | This document states the calibration procedures for the external diameter of plug gauges with the ranges of 20 mm to 100 mm. The calibration method is utilizing Labmaster universal measuring system to calibrate the length of external diameter. Firstly, t the laser interferometer system measured the 20 or 50 mm standard plug gauge for initial condition to reset. Then, it measured client’s plug gauge directly. In this document, there were five subjects about the preliminary operation, calibration steps, post-calibration procedures, data analysis, and calibration reports. |
| 151 | Measurement System Validation Procedure for Plug Gauge-Use of Labmaster Universal Measuring System | This document was drafted about the uncertainty evaluation for the calibration of end standard of plug gauges that are labeled X-class level and mainly dimensional length include the ranges of 20 mm to 100 mm. The calibration method is utilizing Labmaster universal measuring system, to calibrate the length of external diameter. Firstly, the laser interferometer measured the standard plug gauge, whose length was 20 or 50 mm, for initial condition to reset. Then, it measured the plug gauge to be calibrated directly. The measurement uncertainty evaluation in this report was in accordance with the ISO/IEC Guide 98-3:2008 to provide the expanded uncertainty. |
| 152 | Instrument Calibration Technique for Roundness Standard - Rotating Pick-up Type | The document describes the calibration procedure of the roundness measuring system for the National Measurement Laboratory. In this document, a Taylor Hobson TALYROND 73 HPR rotating pick-up type roundness measuring instrument is used. Profile of the customer artifact that rotate along a spindle is measured by an electro-mechanical probe. Out-of roundness can be obtained by the least square circle method to separate the spindle error. This calibration system is attached to the Roundness Calibration System (System code: D12), Measuring range：Roundness standard：(0.001～2 ) μm (out-of-roundness). For 95 ％ confidence level, coverage factor k ＝ 1.97 ~ 2.14, Expanded uncertainty(U) = Q[4.13,67R,2.14σ]nm, where R means the measurement of roundness with μm unit. σ means the value of standard deviation for multi-step measurements with nm unit. |
| 153 | Instrument Calibration Technique for Two-Dimensional Optical Image-Based Standard | This document describes the method used to calibrate two-dimensional optical image-based standard (material: glass or quartz) at National Measurement Laboratory (NML). The distance of two-dimensional optical imaged based standard is measured by two-dimensional optical image-based calibration system under test will ensure traceability to the definition of meter. |
| 154 | Measurement System Validation Procedure for Two-Dimensional Optical Imaged-Based Standard | This document describes the uncertainty evaluation procedures for two-dimensional optical image-based standards calibration system. The analysis is according to ISO/IEC Guide 98-3:2008. After analyzing uncertainty sources, the capabilities of the calibration system are shown as follows. The expanded uncertainties are evaluated with a coverage factor, cooresponding to a level of confidence of approximately 95 ％. Measurement range 10 um ≦ X ≦ 400 mm,10 um ≦ Y ≦ 400 mm Expanded uncertainty 0.19 um to 0.92 um. |
| 155 | Instrument Calibration Technique for Iodine Stabilized He-Ne Lasers | The Instrument Calibration Technique describes the method used to calibrate the iodine stabilized He-Ne lasers by the frequency doubled optical frequency comb at Dimensional Measurement Laboratory of NML. The method applied to the calibration mainly focuses on iodine stabilized He-Ne lasers at 633 nm wavelengths. This system measures the frequency difference between a frequency doubled fiber laser comb and an iodine stabilized He-Ne laser by using the beat frequency technique. Laser frequency of stabilized lasers measured by beating with the calibrated iodine stabilized He-Ne laser will ensure traceability to the definition of metre (System code: D16). |
| 156 | Measurement System Validation Procedure for Iodine Stabilized He-Ne Lasers Calibration System | The Measurement System Validation Procedure describes the method used to evaluate the uncertainty of the measurement system for iodine frequency stabilized lasers at Dimensional Measurement Laboratory of NML. The laser used for the measurement is frequency doubled fiber laser comb, which is well known as the frequency measurement standard for many lasers. The frequency stability is better than an iodine-stabilized He-Ne laser. This system measures the frequency difference between a frequency doubled fiber laser comb and an iodine stabilized He-Ne laser by using the beat frequency technique. The frequency of an iodine-stabilized laser is equal to the frequency of the one of the frequency comb, which can be easily determined, plus or minus the frequency difference. The measurement scope and the uncertainties are shown as below (system code: D16). Measurement scope: wavelength 633 nm (or frequency 474 THz) iodine-stabilized lasers The relative expanded uncertainty Ur is: (95 ％ confidence level and coverage factor k = 1.96) , where fL is the laser frequency under measurement, S is the 1st standard deviation of the measured value (beating frequency). |
| 157 | Instrument Calibration Technique for Coordinate Measuring Machine | This document is the calibration procedures for the coordinate measuring machine (CMM). The cat-eye reflector is mounted on the CMM, and the LaserTRACER traces the movement of the CMM. Thus, the LaserTRACER can measure the length difference between the CMM and the standard sphere implemented in it when the CMM is remained stationary for a short time. The multilateration and Monte Carlo method are used to calculate the LaserTRACER’s position and the accuracy of the CMM. The measurement system currently provides the following capability. Calibration item: coordinate measuring machine Measurement range: (200~ 10000) mm Expanded uncertainty : U = k × uc =1.97 × (0.18 ＋ 6.3 × 10-7 × L) Where L: measurement range Confidence level: 95 ％. Coverage factor (k): 1.97 This document belongs to coordinate measuring machine calibration system |
| 158 | Measurement System Validation Procedure for Coordinate Measuring Machine Calibration System | This document describes the uncertainty evaluation for the coordinate measuring machine (CMM) calibration system in Center for Measurement Standards. The cat-eye reflector is mounted on the CMM, and the LaserTRACER traces the movement of the CMM. When the CMM is remained stationary for a short time, the LaserTRACER can measure the length difference between the CMM and the standard sphere implemented in it. Thus, the positioning accuracy of the CMM can be calibrated. The evaluation process will be divided into two sessions, which are length measurement uncertainty of the LaserTRACER and the LaserTRACER’s coordinate determination error. The ISO/IEC Guide 98-3:2008 is used to evaluate the length measurement uncertainty of the LaserTRACER, and the Monte Carlo method is employed to simulate the its possible coordinate determination error. The calibration system currently provides the following measurement capabilities. Calibration item: coordinate measuring machine Measurement range: (200 ~ 10000) mm Expanded uncertainty: U = k × uc = 1.97 × (0.18 μm ＋ 6.3 × 10-7 × L) Where L: measurement range, unit: mm Confidence level: 95 ％. Coverage factor(k):1.97 This document belongs to coordinate measuring machine calibration system |
| 159 | Measurement System Validation Procedure for Scale Tapes | This document is an assessment report on the calibration system of the standard tape and the invar bar code staff for the Center for Measurement Standards in carrying out the National Measurement Laboratory’s project. The calibration system provides the traceability and the calibration service of invar tape and invar bar code staff for lengths no longer than 10 meters. The calibration system consists of a laser interferometer, a precise rail, a carriage, wireless transmission modules and a positioned microscope with a CCD. It is necessary to adjust the calibrated piece to be parallel with the precise rail and the laser interferometer, the DC stepmotor driving carriage and the microscope to the graduation to be calibrated. When the graduation is in view of the CCD, the deviation between the graduation edge and the center of CCD can be calculated through image processing techniques. The error signal is sent back to drive the carriage to make small movements until the graduation edge overlaps with the CCD center. In the meantime, the displacement of carriage on the graduation to be calibrated will be detected by the laser interferometer. The error source analysis and uncertainties are according to the “Guide to the Expression of Uncertainty in Measurement” published by the International Organization for Standardization (ISO). |
| 160 | Instrument Calibration Technique for Scale Tapes | This document describes the calibration system of the standard tape and the invar bar code staff by the Center for Measurement Standards in carrying out the National Measurement Laboratory’s plan. The calibration system provides the calibration service of for the invar tape and invar bar code staff with lengths less than 10 meters. The calibration system consists of a laser interferometer, a precise rail, a carriage, wireless transmission modules and a positioned microscope with a CCD.. It is necessary to adjust the calibrated piece to be parallel with the precise rail and the laser interferometer. |
| 161 | Measurement System Validation Procedures for Angular Encoder | This document states the uncertainty evaluation procedures for the angular encoders calibration system at National Measurement Laboratory. The calibration method bases on comparison method. The angle standard is self-calibiratable angle measurement equipment which includes a rotary table, a tracable angular encoder and twelve optical readheads. By using self angle calibration, every angle of the angle standard can be calculated. Comparing the angle between the angle standard and the angular encoder, the deviation angle of angular encoder can be calculated. The effects of the influential factors on this calibration system will be considered to estimate the uncertainty according to the ISO/IEC Guide 98-3:2008. The confidence level of this system is 95 ％. This calibration system is attached to the Angle Blocks Calibration System (System code: D06). |
| 162 | Instrument Calibration Technique For Angular Encoder | This document describes the calibration procedures for angular encoders at National measurement Laboratory. The angular encoders to be calibrated are compared with the angle standard. The angle standard is self-calibiratable angle measurement equipment which includes a rotary table, a tracable angular encoder and twelve optical readheads. By using self angle calibration, every angle of the angle standard can be calculated. Comparing the angle between the angle standard and the angular encoder, the deviation angle of angular encoder can be calculated. This calibration system is attached to the Angle Blocks Calibration System (System code: D06). |
| 163 | Instrument Calibration Technique for Roundness Standard - Rotating Table Type | The document describes the calibration procedure of the roundness measuring system for the National Measurement Laboratory. In this document, a Taylor Hobson Talyrond 595H roundness measuring instrument is used. Profile of the customer artifact that rotate along a spindle is measured by an electro-mechanical probe. Out-of roundness can be obtained by the least square circle method to separate the spindle error. This calibration system is attached to the Roundness Calibration System (System code: D12), Measuring range： Roundness standard：(0.001 ~ 2 ) um (out-of-roundness) For 95 ％ confidence level, coverage factor k = 1.97 ~ 2.14, Expanded uncertainty (U) = [32.8, 4.9R, 2.14S] nm, where R denotes the measurement of roundness with um unit, S denotes the value of standard deviation for multi-step measurements with nm unit. |
| 164 | Measurement System Validation Procedures for Roundness Standard Calibration System - Rotating Table Type | The document describes the uncertainty evaluation of the roundness measuring system for the National Measurement Laboratory. In this document, a Taylor Hobson Talyrond 595H roundness measuring instrument is used. Profile of the customer artifact that rotate along a spindle is measured by an electro-mechanical probe. Out-of roundness can be obtained by the least square circle method to separate the spindle error. This calibration system is attached to the Roundness Calibration System (System code: D12), Measuring range： Roundness standard：(0.001 ~ 2 ) um (out-of-roundness) For 95 ％ confidence level, coverage factor k = 1.97 ~ 2.14, Expanded uncertainty (U) = [32.8, 4.9R, 2.14S] nm, where R denotes the measurement of roundness with um unit, S denotes the value of standard deviation for multi-step measurements with nm unit. |
| 165 | Procedure for the Multi-Degree-of-Freedom Errors Measurement Module in Linear Guide Measurement | The content involves the operating procedures for the multi-degree-of-freedom errors measurement module used in linear guide measurement. The measurement module consists of a reference laser, multi-degree-of-freedom sensors, and LabVIEW software. The purpose is to measure multiple degrees of freedom (displacement, rotation) errors of the linear guide. |
| 166 | The Uncertainty Evaluation of Multi-Degree Error Measurement for Linear Guideway | Digital multi-degree geometry error measurement module technology is aimed at replacing the measurement method of traditional straight edge with collimated laser beam as reference standard. It can simultaneously measure linear displacement in horizontal (Y), vertical (Z) directions and angular displacements of Yaw and Pitch with X axis as moving direction. The uncertainty evaluation for this year include calibration of linear and angular displacements, followed by multi-axis measurement application uncertainty evaluation on CMM stage from 0 to 2 m to verify if specifications meet requirements, i.e., uncertainty of linear displacement ? (0.5 μm ＋ 5 × 10^-7 × L); uncertainty of angle ? (0.5 ＋ 5 × 10^-1 m^-1 × L). Here, L represents travel stroke range of (0 ~ 2) m, and related verification will be conducted in environmental specification (20.0 ± 1.0) °C laboratory. |
| 167 | The Customer’s Satisfaction Report of NML in 2024 | This research report was to evaluate the customer’s satisfaction on the calibration/certification services provided by the National Measurement Laboratory, R.O.C. (NML). In order to evaluate the customer’s satisfaction, a customer satisfactory survey was done to gather valuable opinions and reactions from customers. Through evaluation, the correspondence between NML’s services and customers’ demands and expectations was examined and identified. Furthermore, the analysis of the customer satisfactory survey can be used to determine the future directions of calibration/certification service items and to improve the quality of the calibration/certification services. Through analyzing the data, the average rate of satisfactory degree to the NML’s services was 9.3 out of 10 in 2024. However, based on the opinions and expectations from customers, NML still had parts of the service items need to be improved. Therefore, this research report summarizes the opinions and expectations from customers and provides them to the departments of NML for reference. In addition to improving the unsatisfied service items, NML will provide better quality of the calibration/certification service for customers continuously. |